Paper Citation Record · LEDGER

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide

As of 7 August 2026, this Paper Citation Record lists 33 of 33 outbound references and 0 inbound Pith citation observations for arXiv:2506.06222.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2506.06222 v1

Coverage vector

measured 33 of 33 reference resolution

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Source: paper_references, paper_reference_links, observed 2026-08-07T06:06:57.890571Z

measured 33 of 33 standing notices

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Source: scholarly_work_events, retraction_status_cache, observed 2026-08-07T06:34:17.273281+00:00

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Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

33 of 33 outbound references displayed

verified exact21
verified fuzzy7
unresolved3
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External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 87b65c27-d046-403d-9e21-b9cd195d9b9c · outbound

This paper cites Ferroelectricity in hafnium oxide thin films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Ferroelectricity in hafnium oxide thin films,

Reference 1

Resolution: unresolved; no resolver link, observed 2026-08-07T06:06:57.801341Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 6c0f826a-7d89-4865-9e99-805d2373c626 · outbound

This paper cites The fundamentals and applications of ferroelectric HfO2,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide The fundamentals and applications of ferroelectric HfO2,

Reference 2

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.365265Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 52937e58-1cfb-48ee-94bd-f19a49d8fb2a · outbound

This paper cites Ferroelectricity in Simple Binary ZrO 2 and HfO 2,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Ferroelectricity in Simple Binary ZrO 2 and HfO 2,

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.356637Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b4f41e49-baaf-4070-8932-eaf39d1c8b3a · outbound

This paper cites The origin of ferroelectricity in Hf1 −xZrxO2: A computational investigation and a surface energy model,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide The origin of ferroelectricity in Hf1 −xZrxO2: A computational investigation and a surface energy model,

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.347891Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 01e1ec86-40ac-423f-96b4-a17aaa33520a · outbound

This paper cites Scale-free ferroelectricity induced by flat phonon bands in HfO 2,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Scale-free ferroelectricity induced by flat phonon bands in HfO 2,

Reference 5

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.078823Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 63dd0f13-589e-4813-8be9-65d9aa88eac5 · outbound

This paper cites Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories,

Reference 6

Resolution: malformed identifier; raw_fallback, observed 2026-08-07T06:06:58.301718Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 13421a23-ad1a-4196-bb8b-0c8bd6618beb · outbound

This paper cites Hafnium oxide based ferroelectric devices for memories and beyond,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Hafnium oxide based ferroelectric devices for memories and beyond,

Reference 7

Resolution: verified exact; raw_fallback, observed 2026-08-07T06:06:58.232024Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b0e52354-3538-4ddb-9fdd-7ff4bc041485 · outbound

This paper cites The Past, the Present, and the Future of Ferroelectric Memories,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide The Past, the Present, and the Future of Ferroelectric Memories,

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.338588Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 161efd29-32a4-4467-9fb0-558ab6b1d2c3 · outbound

This paper cites A perspective on the physical scaling down of hafnia-based ferroelectrics,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide A perspective on the physical scaling down of hafnia-based ferroelectrics,

Reference 9

Resolution: malformed identifier; no resolver link, observed 2026-08-07T06:06:57.828302Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 293408cc-f89d-4a5b-8d29-6ace92d2677c · outbound

This paper cites Polarization switching in thin doped HfO2 ferroelectric layers,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Polarization switching in thin doped HfO2 ferroelectric layers,

Reference 10

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.065072Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation bad23230-d5fa-484a-8b76-a7a127f2ad50 · outbound

This paper cites Thickness-dependent crystal structure and electric properties of epitaxial ferroelectric Y2O3-HfO2 films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Thickness-dependent crystal structure and electric properties of epitaxial ferroelectric Y2O3-HfO2 films,

Reference 11

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.057072Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 76fa36b4-0a81-40bd-ae03-eaa0ab386d46 · outbound

This paper cites Study on the size effect in Hf0.5Zr0.5O2 films thinner than 8 nm before and after wake-up field cycling,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Study on the size effect in Hf0.5Zr0.5O2 films thinner than 8 nm before and after wake-up field cycling,

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.330133Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation a319a7d9-92df-492c-b1fb-f263033de161 · outbound

This paper cites Material perspectives of HfO2-based ferroelectric films for device applications,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Material perspectives of HfO2-based ferroelectric films for device applications,

Reference 13

Resolution: verified exact; raw_fallback, observed 2026-08-07T06:06:58.170087Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b38fb8ce-dc34-44c3-8c4f-e7ee1e12fa19 · outbound

This paper cites Polarization switching behavior of Hf–Zr–O ferroelectric ultrathin films studied through coercive field characteristics,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Polarization switching behavior of Hf–Zr–O ferroelectric ultrathin films studied through coercive field characteristics,

Reference 14

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.039937Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 55200426-f0a4-4f2c-a977-24539c2dcb56 · outbound

This paper cites Thickness dependence of the coercive electric field of laser ablated niobium-doped lead-zirconium-titanate films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Thickness dependence of the coercive electric field of laser ablated niobium-doped lead-zirconium-titanate films,

Reference 15

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.031275Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 266ef3cb-09ec-425d-bf9d-49acbc259940 · outbound

This paper cites Coercive field of ultrathin Pb(Zr0.52Ti0.48)O3 epitaxial films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Coercive field of ultrathin Pb(Zr0.52Ti0.48)O3 epitaxial films,

Reference 16

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.022840Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b3053a8f-2496-4365-ad78-796ff0bdca5f · outbound

This paper cites On the theory of the coercive field of single-domain crystals of BaTiO3,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide On the theory of the coercive field of single-domain crystals of BaTiO3,

Reference 17

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.014240Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 0afbc730-be9c-4a2a-99b9-5cecb271a825 · outbound

This paper cites Thickness dependence of the nucleation field of triglycine sulphate,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Thickness dependence of the nucleation field of triglycine sulphate,

Reference 18

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.005007Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 1aeff340-85a7-47ce-b275-f417764f68b3 · outbound

This paper cites Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics,

Reference 19

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.995648Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 690ab5ba-ddf5-41f6-8b2a-42c7e5ca45bd · outbound

This paper cites Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment,

Reference 20

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.321191Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation c69cc182-9e83-4094-9920-ba14ab12ab4f · outbound

This paper cites Direction-Dependent Lateral Domain Walls in Ferroelectric Hafnium Zirconium Oxide and their Gradient Energy Coefficients: A First Principles Study.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Direction-Dependent Lateral Domain Walls in Ferroelectric Hafnium Zirconium Oxide and their Gradient Energy Coefficients: A First Principles Study

Reference 21

Resolution: verified exact; local_arxiv, observed 2026-08-07T06:06:58.101732Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation c68b28ed-e5cd-4f2d-9f40-f1238e03baf3 · outbound

This paper cites Atomic-Scale Scanning of Domain Network in the Ferroelectric HfO 2 Thin Film,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Atomic-Scale Scanning of Domain Network in the Ferroelectric HfO 2 Thin Film,

Reference 22

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.987291Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 89346810-eb16-4117-8168-ed75033f367c · outbound

This paper cites Epitaxial Ferroelectric HfO2 Films: Growth, Properties, and Devices,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Epitaxial Ferroelectric HfO2 Films: Growth, Properties, and Devices,

Reference 23

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.978662Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 4291dd0b-a0f8-4be2-984e-67828e56e75b · outbound

This paper cites Growth Window of Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Growth Window of Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films,

Reference 24

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.970024Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation abcbc74c-6f51-41f3-a246-30fdc0d62aae · outbound

This paper cites Epitaxial Ferroelectric La-Doped Hf0.5Zr0.5O2 Thin Films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Epitaxial Ferroelectric La-Doped Hf0.5Zr0.5O2 Thin Films,

Reference 25

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.961644Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 63d65ba0-ae2a-455c-81a0-d0c932fbb088 · outbound

This paper cites A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films,

Reference 26

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T06:06:58.310556Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 5d6fc31e-b997-4e87-98be-9cae274f2989 · outbound

This paper cites Distinguishing the Rhombohedral Phase from Orthorhombic Phases in Epitaxial Doped HfO2 Ferroelectric Films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Distinguishing the Rhombohedral Phase from Orthorhombic Phases in Epitaxial Doped HfO2 Ferroelectric Films,

Reference 27

Resolution: unresolved; no resolver link, observed 2026-08-07T06:06:57.880241Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 845c9b45-e5bd-4ce9-9f07-61e6fd0a9f84 · outbound

This paper cites Non-Kolmogorov-Avrami switching kinetics in ferroelectric thin films,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Non-Kolmogorov-Avrami switching kinetics in ferroelectric thin films,

Reference 28

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.946838Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 687feca7-6e9a-435f-9d74-8bc04f0d20b4 · outbound

This paper cites Phase-field simulations of polarization variations in polycrystalline Hf0.5Zr0.5O2 based MFIM: V oltage dependence and dynamics,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Phase-field simulations of polarization variations in polycrystalline Hf0.5Zr0.5O2 based MFIM: V oltage dependence and dynamics,

Reference 29

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.937842Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 9318d062-cabd-477f-911f-dbef1eab9928 · outbound

This paper cites Electrostatic Considerations in BaTiO3 Domain Formation during Polarization Reversal,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Electrostatic Considerations in BaTiO3 Domain Formation during Polarization Reversal,

Reference 30

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.929168Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 3c2e5b28-c19a-43b9-8570-90365d32aead · outbound

This paper cites Depolarization corrections to the coercive field in thin-film ferroelectrics,.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Depolarization corrections to the coercive field in thin-film ferroelectrics,

Reference 31

Resolution: verified exact; doi, observed 2026-08-07T06:06:57.919716Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b9b142cc-7082-4282-9112-dcfb5312e237 · outbound

This paper cites Available: https://pubs.acs.org/doi/10.1021/nl302049k.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Available: https://pubs.acs.org/doi/10.1021/nl302049k

Reference 2012

Resolution: unresolved; no resolver link, observed 2026-08-07T06:06:57.811088Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0d24434c-27af-40fa-92ba-b4f3ee727489 · outbound

This paper cites Available: https://doi.org/10.1063/1.4935588.

Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide Available: https://doi.org/10.1063/1.4935588

Reference 2015

Resolution: verified exact; doi, observed 2026-08-07T06:06:58.048615Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Pith citing papers

No inbound Pith citation observations are available.