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Measurement of CKM element $|V_{cb}|$ from $W$ boson decays at the future Higgs factories
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abstract
This study investigates the precision measurement of the CKM matrix element $|V_{cb}|$ through semileptonic $WW$ events at future Higgs factories, $i.e.$, FCC-ee, ILC, C$^3$, and CEPC. We use full detector simulation to generate the $WW \to \ell \nu cb$ signal events and various backgrounds at $\sqrt{s} = 240$ GeV with unpolarized beams. The relative statistical uncertainties are projected to be 0.91\% for the muon channel and 1.2\% for the electron channel, assuming a baseline integrated luminosity of 5 ab$^{-1}$. The sensitivities at other Higgs factory scenarios are also projected. Possible contributors to systematic uncertainties are discussed, with the most prominent one being the systematics of flavor-tagging and mistagging rates. Combining with $WW$ threshold runs, the relative systematic uncertainty can be further reduced.
Forward citations
Cited by 1 Pith paper
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Time-Dependent Precision Measurement of $B_s^0\rightarrow \phi \mu^+\mu^-$ Decay at FCC-$ee$
FCC-ee could measure B_s -> phi mu+ mu- branching ratio to 0.5% and time-dependent CP observables D_f, C_f, S_f to 0.1, 0.02, and 0.02, giving order-of-magnitude better Wilson coefficient constraints than pre-FCC projections.
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