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arxiv 2211.11621 v1 pith:XXUF6FIA submitted 2022-11-21 physics.optics physics.ins-det

Tilting refractive x-ray lenses for fine-tuning their focal length

classification physics.optics physics.ins-det
keywords x-raylensesapplicationsbeamlinedesignfine-tuningfocallength
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design: we demonstrate that tilting 1D lenses around their focusing direction can be used for fine-tuning their focal length with possible applications in beamline optical design.

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