Pith. sign in

REVIEW

CAD Tool Design Space Exploration via Bayesian Optimization

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 1912.06460 v1 pith:YCQRIXTW submitted 2019-12-12 cs.OH

CAD Tool Design Space Exploration via Bayesian Optimization

classification cs.OH
keywords designbayesianexplorationoptimizationspaceflowadvancedcomplexity
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

The design complexity is increasing as the technology node keeps scaling down. As a result, the electronic design automation (EDA) tools also become more and more complex. There are lots of parameters involved in EDA tools, which results in a huge design space. What's worse, the runtime cost of the EDA flow also goes up as the complexity increases, thus exhaustive exploration is prohibitive for modern designs. Therefore, an efficient design space exploration methodology is of great importance in advanced designs. In this paper we target at an automatic flow for reducing manual tuning efforts to achieve high quality circuits synthesis outcomes. It is based on Bayesian optimization which is a promising technique for optimizing black-box functions that are expensive to evaluate. Gaussian process regression is leveraged as the surrogate model in Bayesian optimization framework. In this work, we use 64-bit prefix adder design as a case study. We demonstrate that the Bayesian optimization is efficient and effective for performing design space exploration on EDA tool parameters, which has great potential for accelerating the design flow in advanced technology nodes.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.