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Paper Citation Record · LEDGER

Rapid cryogenic characterisation of 1024 integrated silicon quantum dots

As of 9 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:2310.20434.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2310.20434 v1

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 2 of 2 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-09T06:31:02.800959+00:00

measured 2 of 2 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-06T12:59:24.146737Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: arxiv_reference, observed 2026-05-23T21:13:27.721528Z

Reference resolution

0 of 0 outbound references displayed

  • verified exact0
  • verified fuzzy0
  • unresolved0
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

No outbound reference observations are available for this paper version.

Pith citing papers

Observation 409abc24-5b6c-41fc-8d6c-686e1d376918 · inbound

CMOS compatibility of semiconductor spin qubits cites this paper.

CMOS compatibility of semiconductor spin qubits Rapid cryogenic characterisation of 1024 integrated silicon quantum dots

Reference 185

Resolution
verified exact
arxiv_id, observed 2026-05-23T21:13:27.724205Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-09T06:31:02.800959+00:00.

source=pdf_text observed=2026-05-23T21:12:52.044490Z digest=sha256:5c103099e83e00a52c14b8af21b355845b1d5d60cc355d7c33dad770334b3b90

Observation bca2b160-2922-41cc-bb3b-e466c155db3e · inbound

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology cites this paper.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Rapid cryogenic characterisation of 1024 integrated silicon quantum dots

Reference 10

Resolution
unresolved
no resolver link, observed 2026-08-06T12:59:24.146737Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-06T12:59:24.146737Z digest=sha256:8cf4b0921047c94bca5b555d7cb0c2eba446eb3c3c2189bbd4f0167dce976ac7