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Paper Citation Record · LEDGER

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization

As of 18 August 2026, this Paper Citation Record lists 17 of 17 outbound references and 0 inbound Pith citation observations for arXiv:2501.08961.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2501.08961 v1

Coverage vector

measured 17 of 17 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-10T20:20:02.472188Z

measured 17 of 17 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-18T06:34:40.430872+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

17 of 17 outbound references displayed

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  • verified fuzzy16
  • unresolved1
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External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 648fa97f-6871-429c-b7c3-6c037505a177 · outbound

This paper cites Dhumal, Atul P.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Dhumal, Atul P

Reference 1

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation a3a44109-b062-4f06-b437-f1bd283138ab · outbound

This paper cites Thermoelectric coolers for on-chip thermal management: Materials, design, and optimiza- tion.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Thermoelectric coolers for on-chip thermal management: Materials, design, and optimiza- tion

Reference 2

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 6732dff4-9b97-4b3d-bd18-ff97e60399c0 · outbound

This paper cites A review of advanced thermal interface materials with oriented structures for electronic devices.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization A review of advanced thermal interface materials with oriented structures for electronic devices

Reference 3

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Source-reported events for the cited work

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Observation 8cdf3776-c719-4766-a48a-44d0ec1a285f · outbound

This paper cites High thermal conductivity insulators for ther- mal management in 3d integrated circuits.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization High thermal conductivity insulators for ther- mal management in 3d integrated circuits

Reference 4

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 855687b3-a161-4953-a9cc-e58ae7ba39cf · outbound

This paper cites Scanning thermal microscopy: A review.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Scanning thermal microscopy: A review

Reference 5

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 470a5af2-baf4-49f5-bca4-d3c02cc817bc · outbound

This paper cites Scanning thermal microscopy of individual silicon nanowires.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Scanning thermal microscopy of individual silicon nanowires

Reference 6

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation b2cd0469-86ae-4cdd-9c0f-c7b349594657 · outbound

This paper cites Thermal conductivity measurement of a sb2te3 phase change nanowire.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Thermal conductivity measurement of a sb2te3 phase change nanowire

Reference 7

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 922c0cf7-ddb5-4b7c-9172-f77a8c4ccf31 · outbound

This paper cites Juszczyk, M.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Juszczyk, M

Reference 8

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 763b6d87-7fa3-49db-8454-72c6bc929b1c · outbound

This paper cites an unresolved cited work.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Unresolved cited work

Reference 9

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unresolved
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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 3de361c1-1dca-41e5-8a8e-b4aece95afae · outbound

This paper cites Scanning thermal microscopy on samples of varying effective thermal conductivities and identical flat surfaces.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Scanning thermal microscopy on samples of varying effective thermal conductivities and identical flat surfaces

Reference 10

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 065013e3-e72c-467b-a8cc-2046da9c0a3c · outbound

This paper cites Quantitative measurement of thermal conductivity by sthm technique: Measurements, calibration protocols and uncertainty evalua- tion.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Quantitative measurement of thermal conductivity by sthm technique: Measurements, calibration protocols and uncertainty evalua- tion

Reference 11

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation e1b2930d-4603-424e-81f1-5ccf9b2215b3 · outbound

This paper cites Elsevier, North Holland, 1988.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Elsevier, North Holland, 1988

Reference 12

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation c104c97e-7ca0-46d4-ad24-c59d8033fb1b · outbound

This paper cites Quantiheat project: Main progresses.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Quantiheat project: Main progresses

Reference 13

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation f68a1faa-6d34-43cc-8803-add5f86f3470 · outbound

This paper cites Paule and John Mandel.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Paule and John Mandel

Reference 14

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 22777901-472f-4bde-b0e5-5b30a8479dfc · outbound

This paper cites Charv´ atov´ a Campbell, Z.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Charv´ atov´ a Campbell, Z

Reference 15

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 6d7cc78f-70dd-489f-9dd8-5545ad5ebe4b · outbound

This paper cites Applications of iterated linearization for non-linear errors-in-variable regression to metrological data.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Applications of iterated linearization for non-linear errors-in-variable regression to metrological data

Reference 16

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Observation 6fe989ba-fcb6-45cc-a53b-1af953e06d85 · outbound

This paper cites Estimation of function parameters through iterated linearization for nonlinear errors-in-variable regression with corre- lated variables.

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Estimation of function parameters through iterated linearization for nonlinear errors-in-variable regression with corre- lated variables

Reference 17

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

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Pith citing papers

No inbound Pith citation observations are available.