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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing and Storage

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arxiv 1911.11560 v2 pith:ZAJTDLAI submitted 2019-11-18 physics.ins-det cond-mat.mtrl-sci

classification physics.ins-detcond-mat.mtrl-sci
keywords detectorselectrondatathemacquisitiondirectfastmicroscopy
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The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical challenges associated with them. These include issues related to hardware control, and the acquisition, real-time processing and visualisation, and storage of data from such detectors. We discuss these problems and present software solutions for them, with a view to making the benefits of new detectors in the context of STEM more accessible. Throughout, we provide examples of the application of the technologies presented, using data from a Medipix3 direct electron detector. Most of our software is available under an open source licence, permitting transparency of the implemented algorithms, and allowing the community to freely use and further improve upon them.

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  1. Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing

    physics.ins-det 2025-05 conditional novelty 6.0 of 10

    Event-driven 4D-STEM, processed without ever forming dense frames, runs live on consumer hardware and can shrink datasets by orders of magnitude in low-dose and large-scan regimes.

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