Mesoscopic conductance effects in InMnAs structures

Quantum corrections to the electrical conduction of magnetic semiconductors are comparatively unexplored. We report measurements of time-dependent universal conductance fluctuations (TDUCF) and magnetic field dependent universal conductance fluctuations (MFUCF) in micron-scale structures fabricated from two different In$_{1-x}$Mn$_{x}$As thin films. TDUCF and MFUCF increasing in magnitude with decreasing temperature are observed. At 4 K and below, TDUCF are suppressed at finite magnetic fields independent of field orientation.