Domain structure sequence in ferroelectric Pb(Zr0.2Ti0.8)O3 thin film on MgO

The structural evolution of a polydomain ferroelectric Pb(Zr0.2Ti0.8)O3 film was studied by temperature dependent X-ray diffraction. Two critical temperatures were evidenced: T*=740K, corresponding to a change in the domain structure (a/c/a/c to a1/a2/a1/a2), and Tc_film = 825K where the film undergoes a ferroelectricparaelectric phase transition. The films remains tetragonal on the whole range of temperature investigated. The evolutions of the domain structure and lattice parameters were found to be in very good agreement with the calculated domain stability map and theoretical temperature-misfit strain phase diagram respectively.