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arxiv: hep-ex/0003032 · v1 · submitted 2000-03-28 · ✦ hep-ex

Capacitance of Silicon Pixels

classification ✦ hep-ex
keywords measurementscapacitancemadesilicontestarraysbackplanebeen
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Capacitance measurements have been made on silicon pixel sensors of types n+ on n, p+ on n, and n+ on p. The arrays test a variety of implant and gap widths, and the n+ on n devices test several p-stop designs. The measurements examine inter-pixel and backplane contributions and include studies of temperature dependence. Measurements were made before and after irradiation with fluences relevant to LHC experiments and Fermilab Tevatron Run 2.

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