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pith:2B7QWZ3J

pith:2026:2B7QWZ3JMNP7KIBEAFKQNFYWP7

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Ageing Monitoring for Commercial Microcontrollers Based on Timing Windows

Goerschwin Fey, Holger Schlarb, Jiri Kral, Leandro Lanzieri, Thomas C. Schmidt

A software-based method using variable timing windows can monitor hardware ageing in commercial microcontrollers by measuring shifts in maximum operating frequency.

arxiv:2601.02053 v2 · 2026-01-05 · cs.AR · cs.SY · eess.SY

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Claims

C1strongest claim

We empirically validate the method on real hardware and find that it consistently detects temperature-induced degradations in maximum operating frequency of up to 13.79 % across devices for 60 °C temperature increase.

C2weakest assumption

That changes in maximum operating frequency measured via timing windows are caused by hardware ageing rather than transient temperature effects or other unmodeled factors, and that the observed temperature-induced shifts are representative of long-term time-based degradation.

C3one line summary

A timing-window software test on real microcontrollers detects up to 13.79 % drop in maximum frequency for a 60 °C temperature rise, providing a field-deployable ageing monitor.

References

29 extracted · 29 resolved · 0 Pith anchors

[1] Negative bias temperature instability: What do we understand? 2007

[2] A. W. Strong, E. Y . Wuet al.,Hot Carriers. IEEE, 2009, ch. 5 2009

[3] Studying the Degradation of Propaga- tion Delay on FPGAs at the European XFEL, 2024

[4] Ageing Analysis of Embedded SRAM on a Large-Scale Testbed Using Machine Learning, 2023

[5] Evaluation of Dynamic Frequency Control on an Automotive Microcontroller, 2022

Receipt and verification

First computed	2026-05-18T03:09:32.316582Z
Builder	pith-number-builder-2026-05-17-v1
Signature	Pith Ed25519 (`pith-v1-2026-05`) · public key
Schema	pith-number/v1.0

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d07f0b6769635ff5202401550697167fc23e0db49f9fd36ac9257896d97ef11f

Aliases

arxiv: 2601.02053 · arxiv_version: 2601.02053v2 · doi: 10.48550/arxiv.2601.02053 · pith_short_12: 2B7QWZ3JMNP7 · pith_short_16: 2B7QWZ3JMNP7KIBE · pith_short_8: 2B7QWZ3J

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curl -sH 'Accept: application/ld+json' https://pith.science/pith/2B7QWZ3JMNP7KIBEAFKQNFYWP7 \
  | jq -c '.canonical_record' \
  | python3 -c "import sys,json,hashlib; b=json.dumps(json.loads(sys.stdin.read()), sort_keys=True, separators=(',',':'), ensure_ascii=False).encode(); print(hashlib.sha256(b).hexdigest())"
# expect: d07f0b6769635ff5202401550697167fc23e0db49f9fd36ac9257896d97ef11f

Canonical record JSON

{
  "metadata": {
    "abstract_canon_sha256": "5c6c04a6bf111d69a842b8a82c98c57db7ca2bacfa6a78034fd9b5e8d157582b",
    "cross_cats_sorted": [
      "cs.SY",
      "eess.SY"
    ],
    "license": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
    "primary_cat": "cs.AR",
    "submitted_at": "2026-01-05T12:22:27Z",
    "title_canon_sha256": "b49e9f353ce9047675c25fc06bbf4edbb900c543bf8e1bf8ad490b44d8422e76"
  },
  "schema_version": "1.0",
  "source": {
    "id": "2601.02053",
    "kind": "arxiv",
    "version": 2
  }
}