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arxiv: 1304.7609 · v1 · pith:IZWXPBLLnew · submitted 2013-04-29 · 🪐 quant-ph

Quantum metrology: why entanglement?

classification 🪐 quant-ph
keywords entanglementmetrologyprecisionquantumargumentcaseclassconstruction
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We show why and when entanglement is needed for quantum-enhanced precision measurements, and which type of entanglement is useful. We give a simple, intuitive construction that shows how entanglement transforms parallel estimation strategies into sequential ones of same precision. We employ this argument to generalize conventional quantum metrology, to identify a class of noise whose effects can be easily managed, and to treat the case of indistinguishable probes (such as interferometry with light).

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Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

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