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Secondary Scintillation Yield in Pure Xenon

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arxiv physics/0702142 v1 pith:E4BRE2I7 submitted 2007-02-16 physics.ins-det physics.atom-ph

Secondary Scintillation Yield in Pure Xenon

classification physics.ins-det physics.atom-ph
keywords scintillationphotodioderoomsecondarytemperaturexenonnumberobtained
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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The xenon secondary scintillation yield was studied as a function of the electric field in the scintillation region, in a gas proportional scintillation counter operated at room temperature. A large area avalanche photodiode was used for the readout of the VUV secondary scintillation produced in the gas, together with the 5.9 keV x-rays directly absorbed in the photodiode. The latter was used as a reference for the determination of the number of charge carriers produced by the scintillation pulse and, thus, the number of VUV photons impinging the photodiode. A value of 140 photons/kV was obtained for the scintillation amplification parameter. The attained results are in good agreement with those predicted, for room temperature, by Monte Carlo simulation and Boltzmann calculations, as well as with those obtained for saturated xenon vapour, at cryogenic temperatures, and are about a factor of two higher than former results measured at room temperature.

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