Z.X.Zhang
Identifiers
- name variant Z.X.Zhang 0.60 · backfill
Papers (1)
- Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology cond-mat.mtrl-sci · 2013 · author #6
Mentions
- 1307.0327 #6 · backfill · confidence 0.70 Z.X.Zhang