H.X.Huang
Identifiers
- name variant H.X.Huang 0.60 · backfill
Papers (1)
- Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology cond-mat.mtrl-sci · 2013 · author #2
Mentions
- 1307.0327 #2 · backfill · confidence 0.70 H.X.Huang