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H.X.Huang

Identifiers

  • name variant H.X.Huang 0.60 · backfill

Papers (1)

  1. Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology cond-mat.mtrl-sci · 2013 · author #2

Mentions

  • 1307.0327 #2 · backfill · confidence 0.70 H.X.Huang

Frequent Coauthors