Y.W.Zhang
Identifiers
- name variant Y.W.Zhang 0.60 · backfill
Papers (1)
- Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology cond-mat.mtrl-sci · 2013 · author #1
Mentions
- 1307.0327 #1 · backfill · confidence 0.70 Y.W.Zhang