D.V. Yurasov
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Papers (1)
- Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry cond-mat.mtrl-sci · 2017 · author #7
Mentions
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Frequent Coauthors
- A. Csik 1 shared papers
- A. Tolstogouzov 1 shared papers
- A.V. Novikov 1 shared papers
- D.V. Suvorov 1 shared papers
- G.P. Gololobov 1 shared papers
- K. Vad 1 shared papers
- M.N. Drozdov 1 shared papers
- P.A. Yunin 1 shared papers
- S.F. Belykh 1 shared papers
- Y.N. Drozdov 1 shared papers