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A.V. Novikov

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Papers (2)

  1. Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry cond-mat.mtrl-sci · 2017 · author #4
  2. A Simple Way to Estimate the Value of $\bar{\alpha}\equiv\alpha(m^2_Z)$ hep-ph · 1994 · author #2

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