Franziska C. Beyer (3)

Identifiers

• name variant Franziska C. Beyer (3) 0.60 · backfill

Papers (1)

1. Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes quant-ph · 2026 · author #13

Mentions

• 2605.24157 #13 · arxiv_oai · confidence 0.70 Franziska C. Beyer (3)

Frequent Coauthors

• 2) 1 shared papers
• 2) ((1) Chair of Electron Devices at Friedrich-Alexander-Universit\"at Erlangen-N\"urnberg 1 shared papers
• (2) Fraunhofer Institute for Integrated Systems 1 shared papers
• (3) Department of Energy Materials 1 shared papers
• (4) Intego GmbH 1 shared papers
• (5) Leibniz-Institut f\"ur Oberfl\"achenmodifizierung 1 shared papers
• (6) Department of Modern Physics 1 shared papers
• Alexander May (2) 1 shared papers
• Chihang Luo (6) 1 shared papers
• Christian Gobert (2) 1 shared papers
• Christian Miersch (3) 1 shared papers
• Devices Technology 1 shared papers
• Device Technology 1 shared papers
• Fabian Magerl (1) 1 shared papers
• Heino M\"oller (4) 1 shared papers
• Jan F. Dick (1 1 shared papers
• Jannik H. Schwarberg (1) 1 shared papers
• J\"org Schulze (1 1 shared papers
• Martin Siebert (3) 1 shared papers
• Mathias Rommel (2) 1 shared papers