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Devices Technology

Identifiers

  • name variant Devices Technology 0.60 · backfill

Papers (1)

  1. Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes quant-ph · 2026 · author #18

Mentions

  • 2605.24157 #18 · arxiv_oai · confidence 0.70 Devices Technology

Frequent Coauthors