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Mathias Rommel (2)

Identifiers

  • name variant Mathias Rommel (2) 0.60 · backfill

Papers (1)

  1. Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes quant-ph · 2026 · author #14

Mentions

  • 2605.24157 #14 · arxiv_oai · confidence 0.70 Mathias Rommel (2)

Frequent Coauthors