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Andr\'e Scherz

Identifiers

  • name variant Andr\'e Scherz 0.60 · backfill

Papers (1)

  1. Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe cond-mat.mtrl-sci · 2011 · author #2

Mentions

  • 1108.2218 #2 · backfill · confidence 0.70 Andr\'e Scherz

Frequent Coauthors