Andrew R. Schwartz
Identifiers
- name variant Andrew R. Schwartz 0.60 · backfill
Papers (3)
- Near-field scanning microwave microscope for interline capacitance characterization of nanoelectronics interconnect cond-mat.mtrl-sci · 2011 · author #2
- Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe cond-mat.mtrl-sci · 2011 · author #4
- A near-field scanned microwave probe for spatially localized electrical metrology cond-mat.mtrl-sci · 2005 · author #4
Mentions
Frequent Coauthors
- Vladimir V. Talanov 3 shared papers
- Robert L. Moreland 2 shared papers
- Andr\'e Scherz 1 shared papers
- Andre Scherz 1 shared papers