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Andrew R. Schwartz

Identifiers

  • name variant Andrew R. Schwartz 0.60 · backfill

Papers (3)

  1. Near-field scanning microwave microscope for interline capacitance characterization of nanoelectronics interconnect cond-mat.mtrl-sci · 2011 · author #2
  2. Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe cond-mat.mtrl-sci · 2011 · author #4
  3. A near-field scanned microwave probe for spatially localized electrical metrology cond-mat.mtrl-sci · 2005 · author #4

Mentions

  • 1108.2226 #2 · backfill · confidence 0.70 Andrew R. Schwartz
  • 1108.2218 #4 · backfill · confidence 0.70 Andrew R. Schwartz

Frequent Coauthors