Robert L. Moreland

Identifiers

• name variant Robert L. Moreland 0.60 · backfill

Papers (2)

1. Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe cond-mat.mtrl-sci · 2011 · author #3
2. A near-field scanned microwave probe for spatially localized electrical metrology cond-mat.mtrl-sci · 2005 · author #3

Mentions

• 1108.2218 #3 · backfill · confidence 0.70 Robert L. Moreland

Frequent Coauthors

• Andrew R. Schwartz 2 shared papers
• Vladimir V. Talanov 2 shared papers
• Andr\'e Scherz 1 shared papers
• Andre Scherz 1 shared papers