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Michael Moll (2)

Identifiers

  • name variant Michael Moll (2) 0.60 · backfill

Papers (1)

  1. Characterisation of Crystalline Defects in 4H Silicon Carbide using DLTS and TSC physics.ins-det · 2025 · author #5

Mentions

  • 2505.02671 #5 · arxiv_oai · confidence 0.70 Michael Moll (2)

Frequent Coauthors