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Elias Arnqvist (3)

Identifiers

  • name variant Elias Arnqvist (3) 0.60 · backfill

Papers (1)

  1. Characterisation of Crystalline Defects in 4H Silicon Carbide using DLTS and TSC physics.ins-det · 2025 · author #3

Mentions

  • 2505.02671 #3 · arxiv_oai · confidence 0.70 Elias Arnqvist (3)

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