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Niels Sorgenfrei (1

Identifiers

  • name variant Niels Sorgenfrei (1 0.60 · backfill

Papers (1)

  1. Characterisation of Crystalline Defects in 4H Silicon Carbide using DLTS and TSC physics.ins-det · 2025 · author #1

Mentions

  • 2505.02671 #1 · arxiv_oai · confidence 0.70 Niels Sorgenfrei (1

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