MoEIoU is a mixture-of-experts IoU loss using log-sum-exp aggregation and curriculum weighting that reports consistent gains over prior IoU losses on PASCAL VOC, HRIPCB, and MS COCO with YOLO models.
Small defect detection in printed circuit boards based on the multiscale edge strengthening and an improved yolov10.Scientific Reports, 15, 10 2025
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MoEIoU: Rethinking Bounding-Box Regression as a Mixture of Experts
MoEIoU is a mixture-of-experts IoU loss using log-sum-exp aggregation and curriculum weighting that reports consistent gains over prior IoU losses on PASCAL VOC, HRIPCB, and MS COCO with YOLO models.