Sparse sampling of reflectance with five strategically chosen near-IR bandpass filters combined with a multivariate Gaussian model enables non-destructive thickness mapping of 3R-MoS2 on PDMS up to 691 nm with average 8.3 nm 95% CI width.
Interspecimen Comparison of the Refractive Index of Fused Silica
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Phase-sensitive pump-probe hyperspectral imaging enables precise absolute measurement of the optical Kerr coefficient n2 in fused silica near 1 μm, with good agreement to Z-scan after accounting for Raman grating effects.
An analytic PDE model for VUV SiPMs is fitted to 350-830 nm measurements at 163 K and extrapolated to predict performance in liquid xenon and argon.
Cryogenic dual-layer graphene phase modulators on SiN waveguides achieve insertion losses below 0.3 dB, modulation lengths under 50 μm, and GHz bandwidths via geometry and material optimization.
citing papers explorer
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Sparse Spectral Imaging for Thickness Mapping of 3R-MoS$_2$ on PDMS
Sparse sampling of reflectance with five strategically chosen near-IR bandpass filters combined with a multivariate Gaussian model enables non-destructive thickness mapping of 3R-MoS2 on PDMS up to 691 nm with average 8.3 nm 95% CI width.
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Precise measurement of the Kerr coefficient using phase-sensitive pump-probe hyperspectral imaging
Phase-sensitive pump-probe hyperspectral imaging enables precise absolute measurement of the optical Kerr coefficient n2 in fused silica near 1 μm, with good agreement to Z-scan after accounting for Raman grating effects.
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Demonstrating a broadband Photon Detection Efficiency model on VUV sensitive Silicon Photomultipliers
An analytic PDE model for VUV SiPMs is fitted to 350-830 nm measurements at 163 K and extrapolated to predict performance in liquid xenon and argon.
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Cryogenic Graphene-Based Phase Modulators for Quantum Information Processing
Cryogenic dual-layer graphene phase modulators on SiN waveguides achieve insertion losses below 0.3 dB, modulation lengths under 50 μm, and GHz bandwidths via geometry and material optimization.