Model-based statistical analysis identifies Al film thickness fluctuations as the dominant source of critical current variation in Al/AlOx/Al Josephson junctions, with 30-degree deposition improving uniformity to 1.2% RSD over 9.75 mm.
Improving Josephson junction reproducibility for superconducting quantum circuits: junction area fluctuation
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A review summarizing superconducting qubit types, DiVincenzo criteria implementations, coherence limits from defects, and large-scale integration strategies for quantum computing.
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Geometric dependence of critical-current variation in Al/AlO${\rm _x}$/Al Josephson junctions: a model-based analysis
Model-based statistical analysis identifies Al film thickness fluctuations as the dominant source of critical current variation in Al/AlOx/Al Josephson junctions, with 30-degree deposition improving uniformity to 1.2% RSD over 9.75 mm.
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Review of Superconducting Qubit Devices and Their Large-Scale Integration
A review summarizing superconducting qubit types, DiVincenzo criteria implementations, coherence limits from defects, and large-scale integration strategies for quantum computing.