A thin SiO2 cap modifies the surface chemistry of reactive or non-selective masks to achieve SiO2-like selectivity in III-V MBE without degrading optical response.
Force measurements with the atomic force microscope: Technique, interpretation and applications , volume=
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Tip-sample interaction noise in ambient DAFM arises from stochastic nanoscopic liquid neck formation and rupture, providing chemical contrast complementary to KPFM.
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Surface Modification for III-V Selective Area Molecular Beam Epitaxy of Non-Selective Mask Materials
A thin SiO2 cap modifies the surface chemistry of reactive or non-selective masks to achieve SiO2-like selectivity in III-V MBE without degrading optical response.
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Deciphering Noise in tip--sample Interactions: Insights into Nanoscale Dynamics
Tip-sample interaction noise in ambient DAFM arises from stochastic nanoscopic liquid neck formation and rupture, providing chemical contrast complementary to KPFM.