Weak antilocalization effect in LPE-grown p-Hg0.8Cd0.2Te thin film and the evidence of Te-precipitation
classification
❄️ cond-mat.mtrl-sci
quant-ph
keywords
antilocalizationeffectweakfilmobservedte-precipitationthinanalysis
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The weak antilocalization effect is observed in a p-type Hg0.8Cd0.2Te thin film with thickness ~10 micrometers. Based on the analysis of composition, carrier species and excellent fitting of data with a model concerning weak antilocalization effect in Te crystal, the most plausible explanation is that the observed weak antilocalization effect is caused by Te-precipitation.
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