Experimental quantum verification in the presence of temporally correlated noise

Growth in the complexity and capabilities of quantum information hardware mandates access to practical techniques for performance verification that function under realistic laboratory conditions. Here we experimentally characterise the impact of common temporally correlated noise processes on both randomised benchmarking (RB) and gate-set tomography (GST). We study these using an analytic toolkit based on a formalism mapping noise to errors for arbitrary sequences of unitary operations. This analysis highlights the role of sequence structure in enhancing or suppressing the sensitivity of quantum verification protocols to either slowly or rapidly varying noise, which we treat in the limiting cases of quasi-DC miscalibration and white noise power spectra. We perform experiments with a single trapped $^{171}$Yb$^{+}$ ion as a qubit and inject engineered noise ($\propto \sigma^z$) to probe protocol performance. Experiments on RB validate predictions that the distribution of measured fidelities over sequences is described by a gamma distribution varying between approximately Gaussian for rapidly varying noise, and a broad, highly skewed distribution for the slowly varying case. Similarly we find a strong gate set dependence of GST in the presence of correlated errors, leading to significant deviations between estimated and calculated diamond distances in the presence of correlated $\sigma^z$ errors. Numerical simulations demonstrate that expansion of the gate set to include negative rotations can suppress these discrepancies and increase reported diamond distances by orders of magnitude for the same error processes. Similar effects do not occur for correlated $\sigma^x$ or $\sigma^y$ errors or rapidly varying noise processes, highlighting the critical interplay of selected gate set and the gauge optimisation process on the meaning of the reported diamond norm in correlated noise environments.