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Time-Resolved In Situ Liquid-Phase Atomic Force Microscopy and Infrared Nanospectroscopy during the Formation of Metal-Organic Framework Thin Films

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arxiv 2002.00683 v1 pith:G3GDTDL6 submitted 2020-02-03 physics.chem-ph cond-mat.mtrl-sci

classification physics.chem-phcond-mat.mtrl-sci
keywords nucleationgrowthhkust-1thin-filmsformationframeworkgrowinginfrared
verification ladder T0 review T1 audit T2 compute T3 formal
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Metal-organic framework (MOF) thin-films show unmatched promise as smart membranes and photo-catalytic coatings. However, their nucleation and growth resulting from intricate molecular assembly processes are not well understood, yet crucial to control the thin-film properties. Here, we directly observe the nucleation and growth behaviour of HKUST-1 thin-films by real-time in-situ AFM at different temperatures in the Cu-BTC solution. In combination with ex-situ infrared (nano-)spectroscopy, synthesis at 25{\deg}C reveals initial nucleation of rapidly growing HKUST-1 islands surrounded by a continuously nucleating, but slowly growing HKUST-1 carpet. Monitoring at 13{\deg}C and 50{\deg}C shows the strong impact of temperature on thin-film formation, resulting in (partial) nucleation and growth inhibition. The nucleation and growth mechanisms as well as their kinetics provide insights to aid in future rational design of MOF thin-films.

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