REVIEW 3 major objections 5 minor 79 references
Design for light-based spherical aberration correction of ultrafast electron microscopes
T0 review · 3 major / 5 minor · reviewed 2026-08-10 · deepseek-v4-flash
Pith's one-line read Simulations show that a shaped laser pulse near the electron crossover cancels primary spherical aberration in an ultrafast electron microscope, restoring round shadow images over an 8.1 mrad semi-angle.
desk verdict A solid UTEM ponderomotive aberration-correction design study, but the headline 8.1 mrad is an input aperture angle, not a demonstrated output for the actual shaped beams. read the letter →
The pith
A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.
The reading
What carries the argument
The load-bearing mechanism is the ponderomotive phase plate: a laser focus that imprints a transverse phase on the electron wavefunction, with the phase proportional to the local laser intensity. In the non-recoil, paraxial, monochromatic limit, an electron crossing the focus acquires $\varphi(x,y)\propto \frac{E_L \lambda_L^2}{E_e} \frac{g^2(x,y)}{\int g^2}$, and because the interaction sits at the electron crossover, the local propagation angle $\theta$ scales with the transverse coordinate $r$, so a quartic or inverse-quartic $g^2$ becomes a $\theta^4$ phase that directly opposes the primary spherical aberration. The practical enabler is the beam-shaping loop: a spatial light modulator displays a phase mask, and a gradient-descent algorithm optimizes the coefficients of Zernike polynomials (plus a charge-3 vortex for the quartic beam) to match the target intensity profile. The paper reports a correlation of 98.5% in the region of interest for the quartic beam.
What would settle it
In an actual 30 keV ultrafast microscope with $C_s\approx 80$ mm, record the shadow image of the Si$_3$N$_4$ hole array with the laser off and then on with the designed quartic or inverse-quartic beam at 0.2 µJ: the central claim is falsified if the round, undistorted shadow is not restored across the 8.1 mrad aperture, or if the measured electron deflection angle does not match $(1/k)\partial\varphi/\partial x$ from Eq. (4). A simpler check is to measure the shaped laser intensity profile directly and verify that the quartic fit reaches $Q^2\approx 0.99$; a realized profile that departs from quartic cannot produce the claimed correction.
Extended reading notes
Core claim
For a 30 keV electron lens with spherical aberration coefficient $C_s\approx 80$ mm and focal length 8 mm, the primary spherical aberration phase is $\phi(\theta)=\frac{\pi}{2\lambda_e} C_s \theta^4$. The authors show that a counter-propagating laser pulse with intensity profile $g^2(x,y)=1-r^4$ or $g^2(x,y)=r^4$ produces a ponderomotive phase $\varphi(x,y)=-\frac{\alpha}{2\pi(1+\beta)} \frac{E_L \lambda_L^2}{E_e} \frac{g^2}{\int g^2}$, which, placed near the electron crossover, is exactly the opposite of the lens aberration when the pulse energy is chosen appropriately. With an optimized pulse energy of 0.2 µJ, both positive and negative spherical aberration phases are compensated without introducing defocus, and the simulated shadow images of a hexagonal array of 50 nm holes return to round shapes across the full 8.1 mrad aperture. The required quartic and inverse-quartic light distributions are obtained from a Gaussian beam by a spatial-light-modulator phase mask: a gradient-descent search over radial Zernike coefficients produces an inverse-quartic beam with 71% efficiency and a quartic beam (using a charge-3 vortex plus Zernike terms) with 27% efficiency, with fit qualities $Q^2=0.983$ and $Q^2=0.995$.
Load-bearing premise
The whole scheme stands on the assumption that each electron sees the same laser intensity all along its roughly 20-µm pass through the focus, so the laser acts as a pure thin phase plate; the authors note that this breaks down for numerical apertures above about 0.2, and beam drift also spoils the exact cancellation.
Editorial extensions
If this is right
- Spherical aberration can be cancelled without adding defocus, so the correction works at $\Delta z=0$ and does not require retuning the lens current.
- The usable convergence semi-angle of a 30 keV, $C_s\approx 80$ mm lens extends to 8.1 mrad, which would allow larger objective apertures and therefore higher probe current.
- Because the phase plate is programmable, the same setup could be adapted to correct higher-order aberrations by adding non-radially symmetric Zernike modes.
- The shadow-imaging geometry with Si$_3$N$_4$ hole arrays provides an aberration diagnostic suited to ultrafast electron microscopes, where conventional Ronchigrams are impractical.
- Stable operation requires laser pointing stability at the ~4 nrad level and pulse-energy stability below 1% rms, with beam displacement kept below 1.5% of the corrected beam diameter.
Reading between the lines
- One consequence not pursued in the paper: because the ponderomotive phase scales as $E_L \lambda_L^2/E_e$, the same correction at higher electron energies or shorter laser wavelengths would require proportionally more pulse energy, so the scheme is best matched to low- and medium-energy ultrafast instruments.
- The same spatial-light-modulator phase plate could imprint arbitrary low-order aberrations on demand, turning the corrector into a general programmable electron wavefront shaper; the paper demonstrates only radially symmetric quartic corrections.
- The shadow-image diagnostic itself could become a routine alignment tool for any electron-light interaction experiment, since it directly visualizes wavefront distortion without needing high electron current.
- The correction is monochromatic: the residual chromatic aberration from a 0.5 eV energy spread still broadens the probe, so a chromatic corrector or monochromator would be the natural next step.
Signed reviews
Editorial analysis
A structured set of objections, weighed in public.
Referee Report
Summary. The paper proposes correcting primary spherical aberration in ultrafast electron microscopes by imprinting a ponderomotive phase on the electron beam with a shaped laser pulse near the electron crossover. The authors derive the condition that the laser intensity profile g^2(x,y) must match a quartic or inverse-quartic form to cancel the Cs theta^4 aberration phase (Eq. 4), and they present ray-optics and wave-optics simulations of electron shadow images that show round hole patterns when this condition is imposed. They then use a gradient-descent algorithm with Zernike polynomials to design phase masks that shape a Gaussian beam into approximate inverse-quartic and quartic intensity distributions, reporting fit qualities Q^2 = 0.983 and 0.995 and efficiencies of 71% and 27%. The abstract claims an aberration-free angle of 8.1 mrad.
Significance. If the proposed scheme works as claimed, it would offer a programmable, light-based alternative to multipole or material-based aberration correctors for UTEMs, potentially enabling larger probe apertures and higher probe currents. The paper's combination of ray and wave optics simulations for the ideal phase plate is internally consistent, and the gradient-descent beam-shaping results with quantified fit quality are a useful design contribution. However, the central demonstration is currently limited to an idealized phase plate: the electron-light simulations use g^2 = 1-r^4 or r^4 directly, and the actual optimized laser beams are not propagated through the electron interaction. The 8.1 mrad figure is an input aperture angle, not a derived performance limit. These gaps mean the paper shows a promising proof-of-principle rather than a validated design for the claimed aberration-free angle.
major comments (3)
- [Section 3, Figs. 2-4] The electron-light simulations in Fig. 2 set g^2(x,y) in Eq. 4 to the ideal profiles 1-r^4 and r^4 (stated in the paragraph after Fig. 4), while the optimized laser beams in Figs. 3 and 4 are characterized only by Q^2 = 0.983 and 0.995 and efficiencies of 71% and 27%. These two simulation lines are never connected: the actual beam-shaping residuals are not propagated through the electron-light interaction, so the paper does not quantify how deviations from the ideal quartic profiles degrade the round shadow images or the 8.1 mrad claim. This is load-bearing because the correction phase at the aperture edge is about 77 rad for Cs = 80 mm and theta_max = 8.1 mrad, so a relative intensity error of a few percent produces a phase error of order 1 rad, far exceeding a lambda/14 tolerance. The authors should either propagate the optimized beams through the electron simulation or provide a tolerance analysis showing that the achieved Q^2 values are sufficient.
- [Abstract and Section 3] The 'aberration free angle of 8.1 mrad' is the input semi-convergence angle determined by the stated lens parameters (130 µm beam diameter, f = 8 mm, hence theta_max = 8.1 mrad), not a derived output of the simulations. The simulations demonstrate correction at that chosen angle under the ideal-profile assumption, but no calculation is given for the maximum correctable angle as a function of available pulse energy, phase-error tolerance, or the NA<0.2 validity limit. Furthermore, because the correction condition phi = -varphi is imposed by construction when choosing g^2, the agreement between ray and wave optics in Fig. 2 confirms the numerical implementation of Eq. 4 but does not by itself validate the physical feasibility beyond an ideal phase plate. The abstract should be reworded to state that 8.1 mrad is an example design point, or the authors should add a derivation of the achievable aberration-free angle from the system constraints.
- [Section 2, Eq. 4; Section 4] The phase-imprint model in Eq. 4 assumes the laser intensity is constant along the electron propagation direction over the interaction length and that the electron does not move significantly transversely during the interaction. The authors correctly note in Section 4 that NA > 0.2 could break this assumption, but the proposed laser shaping uses NA = 0.16-0.2 and an interaction length of about 20 µm, while the electron convergence angle is 8.1 mrad. Electrons at the edge of the aperture therefore traverse a transverse intensity gradient during the interaction, and the resulting phase error is not estimated. Because the correction phase is large (~77 rad at the edge), even small axial or transverse variations in the focused laser field could produce non-negligible residual aberration. The authors should validate Eq. 4 for their specific parameters by integrating U(r + vt, t) over the full interaction region for the actual focused field, or by estimating the phase error from the longitudinal intensity profile.
minor comments (5)
- [Section 2.2] There is a typo in the fourth sentence: 'simulate the the electron beam' should read 'simulate the electron beam'.
- [Section 3] The word 'Additionaly' in the paragraph describing the mirror hole is misspelled; it should be 'Additionally'.
- [Fig. 2 caption] The caption contains 'elipitic shape', which should be 'elliptic shape'. Similar typos appear elsewhere ('intesities', 'Coresponding', 'elipitic').
- [Section 3 and Fig. 3] The symbol r0 is used for the electron beam radius in Eq. 5 and for the region of interest in the laser shaping (r0 <= 5 µm in Fig. 3), but the two uses are not explicitly distinguished. Please clarify the definition of r0 in each context, particularly since Section 4 later mentions a 'shaping radius r0 > 5 µm'.
- [Appendix C] The misalignment analysis in Eqs. 39-42 considers only static displacement of the correction phase, but the text in Section 4 also recommends 1% rms pulse energy stability. The effect of this intensity noise on the correction phase is not analyzed, even though the large edge phase makes intensity fluctuations a plausible source of residual aberration. A brief estimate would strengthen the practical recommendations.
Circularity Check
The 8.1 mrad 'aberration-free angle' is the chosen θ_max, and the electron-light simulation is run with g² set to the exact 1−r⁴/r⁴ profiles required by the imposed condition φ = −φ; the actual optimized laser beams are never propagated through the electron model.
-
self definitional
[Section 2, Eq. (4) and the φ = −φ condition; Section 3, Fig. 2 simulation setup]
"To correct for the electron aberrations acquired in the magnetostatic lens, we need to introduce an opposite phase shift that cancels out the distortions. To achieve ideal aberration correction, the condition φ(θ(x,y)) = −φ(x,y) must be satisfied, which implies that g2(x,y) should exhibit an inverse quartic or quartic profile ... To simulate the images in Fig. 2 (b), (f) and Fig. 2 (d), (h), the g2(x,y) in Eq. 4 was set to 1−r4 and r4, respectively."
The laser phase φ in Eq. (4) is proportional to g², and the simulation imposes g² = 1−r⁴ or r⁴ selected so that φ is the exact negative of the aberration phase φ. The round shadow images and the cancellation therefore follow from the input by construction (the Fig. 2 caption even states δθ_a = −δθ_L). This is a consistency check of the designed phase profile, not an independent prediction that a realized light field corrects the aberration.
-
fitted input called prediction
[Abstract; Section 3, electron-beam simulation parameters]
"Our simulations of electron-light interactions indicate that spherical aberrations can be compensated resulting in an aberration free angle of 8.1 mrad. ... The electron lens has a focal length f = 8 mm (Cs ∝ f3 ~ 80 mm, Δz=0), with a beam diameter at the lens of 130 µm leading to θmax = 8.1 mrad."
The headline 'aberration free angle of 8.1 mrad' is not a derived output; it is the pre-selected θmax used to set the aperture in the simulation. The simulation demonstrates cancellation over that radius for the ideal g² inserted into Eq. (4), so the quantitative claim is the input parameter renamed as a result, rather than a property established for the actual shaped beams.
full rationale
The paper contains one clearly non-circular component: the gradient-descent beam shaping in Section 3 and Appendix B optimizes a Gaussian beam against external quartic and inverse-quartic target profiles, giving Q² = 0.983 and 0.995; that comparison is meaningful and independent. The circularity is confined to the central electron-light demonstration. The ideal correction phase is defined by the requirement φ = −φ, and then the electron-wave/ray simulations insert exactly the g² = 1−r⁴ and r⁴ forms that make that equality hold (Eq. 4), so the resulting round shadow images and 8.1 mrad 'aberration-free angle' are equivalent to the input by construction. The 8.1 mrad value itself is the chosen θmax, not a predicted limit. Moreover, the actual optimized laser profiles from Figs. 3 and 4 are never propagated through the electron simulation, so residual shaping errors are not quantified in the headline claim. This is a load-bearing gap and a partial circularity, not a full collapse: the concept would still work if a laser field with the ideal quartic/inverse-quartic footprint could be produced, as the authors' stated condition shows. Self-citations for Eq. (4) are not separately counted because the formula is a standard ponderomotive-phase result and is not the locus of the circularity.
Assumptions & free parameters
free parameters (3)
- Zernike coefficients for inverse quartic beam (a5, a13, a25, a41, a61, a85) =
[0.6547, 0.3183, -0.1863, -0.1290, -0.0024, 0.0298]
- Zernike coefficients for quartic beam (a5, a13, a25, a41, a61, a85) =
[0.6937, 0.0148, -0.3022, 0.0739, 0.0354, -0.0212]
- Laser pulse energy E_L at the interaction plane =
0.2 microjoule
assumptions (5)
- domain assumption Non-recoil approximation: the electron energy change from the laser is small compared to its mean energy, reducing the Dirac equation to the effective Schroedinger equation (Eq. 2).
- domain assumption Paraxial, monochromatic, counter-propagating geometry for electrons and light in the phase integral leading to Eq. 4.
- domain assumption Thin sample approximation: the 260 nm Si3N4 film is treated as a binary transmission mask with 0 or 1 transmission, neglecting thickness, elastic scattering, and inelastic effects.
- domain assumption Axial uniformity of the laser field over the interaction length, so the laser acts as a thin phase plate.
- domain assumption Idealized electron source: fully coherent beam, no vibrations, no higher-order aberrations, no Johnson noise.
Cite this review
Pith. "Pith review of Design for light-based spherical aberration correction of ultrafast electron microscopes." pith.science (2026). https://pith.science/paper/6URS7FEQ
@misc{pith2026250105157,
author = {Pith},
title = {Pith review of: Design for light-based spherical aberration correction of ultrafast electron microscopes},
year = {2026},
howpublished = {\url{https://pith.science/paper/6URS7FEQ}},
note = {Machine review of arXiv:2501.05157}
}
abstract
We theoretically demonstrate that ponderomotive interactions near the electron cross-over can be used for aberration correction in ultrafast electron microscopes. Highly magnified electron shadow images from Si$_3$N$_4$ thin films are utilized to visualize the distortions induced by spherical aberrations. Our simulations of electron-light interactions indicate that spherical aberrations can be compensated resulting in an aberration free angle of \SI{8.1}{mrad}. For achieving the necessary light distribution, we use a gradient descent algorithm to optimize Zernike polynomials and shape the light beam into a modified Gaussian and Laguerre-Gaussian beam.
Figures
Figures from the paper (5 more)
Reference graph
Works this paper leans on
-
[1]
Four-dimensional electron microscopy,
A. H. Zewail, “Four-dimensional electron microscopy,” science328, 187–193 (2010)
work page 2010
-
[2]
A. Arbouet, G. M. Caruso, and F. Houdellier, “Ultrafast transmission electron microscopy: historical development, instrumentation, and applications,” Adv. imaging electron physics207, 1–72 (2018)
work page 2018
-
[3]
Ultrafast transmission electron microscopy: Techniques and applications,
E. Montgomery, D. Leonhardt, and J. Roehling, “Ultrafast transmission electron microscopy: Techniques and applications,” Microsc. Today29, 46–54 (2021)
work page 2021
-
[4]
Attosecond electron-beam technology: a review of recent progress,
Y. Morimoto, “Attosecond electron-beam technology: a review of recent progress,” Microscopy72, 2–17 (2023)
work page 2023
-
[5]
A. Feist, N. Bach, N. R. da Silva,et al., “Ultrafast transmission electron microscopy using a laser-driven field emitter: Femtosecond resolution with a high coherence electron beam,” Ultramicroscopy176, 63–73 (2017)
work page 2017
-
[6]
F. Houdellier, G. M. Caruso, S. Weber,et al., “Development of a high brightness ultrafast transmission electron microscope based on a laser-driven cold field emission source,” Ultramicroscopy186, 128–138 (2018)
work page 2018
-
[7]
C. Zhu, D. Zheng, H. Wang,et al., “Development of analytical ultrafast transmission electron microscopy based on laser-driven schottky field emission,” Ultramicroscopy209, 112887 (2020)
work page 2020
-
[8]
Aspherical-aberration-corrected200kvtransmissionelectronmicroscope,
M.Haider, H.Rose, S.Uhlemann, et al., “Aspherical-aberration-corrected200kvtransmissionelectronmicroscope,” Ultramicroscopy 75, 53–60 (1998)
work page 1998
Show all 79 references
-
[9]
Advancingthehexapolecs-correctorforthescanningtransmission electron microscope,
H.Müller,S.Uhlemann,P.Hartel,andM.Haider,“Advancingthehexapolecs-correctorforthescanningtransmission electron microscope,” Microsc. Microanal.12, 442–455 (2006)
2006
-
[10]
Historical aspects of aberration correction,
H. H. Rose, “Historical aspects of aberration correction,” J. electron microscopy58, 77–85 (2009)
2009
-
[11]
Towards sub-å electron beams,
O. Krivanek, N. Dellby, and A. Lupini, “Towards sub-å electron beams,” Ultramicroscopy78, 1–11 (1999)
1999
-
[12]
Sphericalaberrationcorrectioninascanningtransmissionelectronmicroscope using a sculpted thin film,
R.Shiloh,R.Remez,P.-H.Lu, et al.,“Sphericalaberrationcorrectioninascanningtransmissionelectronmicroscope using a sculpted thin film,” Ultramicroscopy189, 46–53 (2018)
2018
-
[13]
Shaping of electron beams using sculpted thin films,
D. Roitman, R. Shiloh, P.-H. Lu,et al., “Shaping of electron beams using sculpted thin films,” ACS photonics8, 3394–3405 (2021)
2021
-
[14]
Whatspatiallightmodulatorscandoforopticalmicroscopy,
C.Maurer,A.Jesacher,S.Bernet,andM.Ritsch-Marte,“Whatspatiallightmodulatorscandoforopticalmicroscopy,” Laser & Photonics Rev.5, 81–101 (2011)
2011
-
[15]
Roadmap on structured light,
H. Rubinsztein-Dunlop, A. Forbes, M. V. Berry,et al., “Roadmap on structured light,” J. Opt.19, 013001 (2016)
2016
-
[16]
Adaptive optics for high-resolution imaging,
K. M. Hampson, R. Turcotte, D. T. Miller,et al., “Adaptive optics for high-resolution imaging,” Nat. Rev. Methods Primers 1, 1–26 (2021)
2021
-
[17]
Demonstration of a 2×2 programmable phase plate for electrons,
J. Verbeeck, A. Béché, K. Müller-Caspary,et al., “Demonstration of a 2×2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018)
2018
-
[18]
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (tem)?
F. V. Ibáñez, A. Béché, and J. Verbeeck, “Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (tem)?” (2022)
2022
-
[19]
Design of electrostatic aberration correctors for scanning transmission electron microscopy,
S. M. Ribet, S. E. Zeltmann, K. C. Bustillo,et al., “Design of electrostatic aberration correctors for scanning transmission electron microscopy,” Microsc. Microanal.29, 1950–1960 (2023)
2023
-
[20]
Quantum wavefront shaping with a 48-element programmable phase plate for electrons,
C.-P. Yu, F. Vega Ibañez, A. Béché, and J. Verbeeck, “Quantum wavefront shaping with a 48-element programmable phase plate for electrons,” SciPost Phys.15, 223 (2023)
2023
-
[21]
Generation of nondiffracting electron bessel beams,
V. Grillo, E. Karimi, G. C. Gazzadi,et al., “Generation of nondiffracting electron bessel beams,” Phys. Rev. X4, 011013 (2014)
2014
-
[22]
Photon-induced near-field electron microscopy,
B. Barwick, D. J. Flannigan, and A. H. Zewail, “Photon-induced near-field electron microscopy,” Nature462, 902–906 (2009)
2009
-
[23]
Attosecond coherent control of free-electron wave functions using semi-infinite light fields,
G. M. Vanacore, I. Madan, G. Berruto,et al., “Attosecond coherent control of free-electron wave functions using semi-infinite light fields,” Nat. communications9, 2694 (2018)
2018
-
[24]
Ultrafast generation and control of an electron vortex beam via chiral plasmonic near fields,
G. M. Vanacore, G. Berruto, I. Madan,et al., “Ultrafast generation and control of an electron vortex beam via chiral plasmonic near fields,” Nat. materials18, 573–579 (2019)
2019
-
[25]
Electron beam aberration correction using optical near fields,
A. Konečná and F. J. G. de Abajo, “Electron beam aberration correction using optical near fields,” Phys. Rev. Lett. 125, 030801 (2020)
2020
-
[26]
Shaping quantum photonic states using free electrons,
A. Ben Hayun, O. Reinhardt, J. Nemirovsky,et al., “Shaping quantum photonic states using free electrons,” Sci. Adv. 7, eabe4270 (2021)
2021
-
[27]
Integrated photonics enables continuous-beam electron phase modulation,
J.-W. Henke, A. S. Raja, A. Feist,et al., “Integrated photonics enables continuous-beam electron phase modulation,” Nature 600, 653–658 (2021)
2021
-
[28]
Imprinting the quantum statistics of photons on free electrons,
R. Dahan, A. Gorlach, U. Haeusler,et al., “Imprinting the quantum statistics of photons on free electrons,” Science 373, eabj7128 (2021)
2021
-
[29]
Cavity-mediated electron-photon pairs,
A. Feist, G. Huang, G. Arend,et al., “Cavity-mediated electron-photon pairs,” Science377, 777–780 (2022)
2022
-
[30]
Ultrafast transverse modulation of free electrons by interaction with shaped optical fields,
I. Madan, V. Leccese, A. Mazur,et al., “Ultrafast transverse modulation of free electrons by interaction with shaped optical fields,” ACS photonics9, 3215–3224 (2022)
2022
-
[31]
Tunable photon-induced spatial modulation of free electrons,
S. Tsesses, R. Dahan, K. Wang,et al., “Tunable photon-induced spatial modulation of free electrons,” Nat. Mater.22, 345–352 (2023)
2023
-
[32]
Spatiotemporal electron beam focusing through parallel interactions with shaped optical fields,
F. J. García de Abajo and C. Ropers, “Spatiotemporal electron beam focusing through parallel interactions with shaped optical fields,” Phys. Rev. Lett.130, 246901 (2023)
2023
-
[33]
High-intensity kapitza-dirac effect,
P. H. Bucksbaum, D. W. Schumacher, and M. Bashkansky, “High-intensity kapitza-dirac effect,” Phys. Rev. Lett.61, 1182–1185 (1988)
1988
-
[34]
Observation of the kapitza–dirac effect,
D. L. Freimund, K. Aflatooni, and H. Batelaan, “Observation of the kapitza–dirac effect,” Nature413, 142–143 (2001)
2001
-
[35]
Femtosecond electron diffraction:‘making the molecular movie’,
J. R. Dwyer, C. T. Hebeisen, R. Ernstorfer,et al., “Femtosecond electron diffraction:‘making the molecular movie’,” Philos. Trans. Royal Soc. A: Math. Phys. Eng. Sci.364, 741–778 (2006)
2006
-
[36]
Ponderomotive Generation and Detection of Attosecond Free-Electron Pulse Trains,
M. Kozák, N. Schönenberger, and P. Hommelhoff, “Ponderomotive Generation and Detection of Attosecond Free-Electron Pulse Trains,” Phys. Rev. Lett.120, 103203 (2018)
2018
-
[37]
Laser phase plate for transmission electron microscopy,
O. Schwartz, J. J. Axelrod, S. L. Campbell,et al., “Laser phase plate for transmission electron microscopy,” Nat. methods 16, 1016–1020 (2019)
2019
-
[38]
Observation of the relativistic reversal of the ponderomotive potential,
J. J. Axelrod, S. L. Campbell, O. Schwartz,et al., “Observation of the relativistic reversal of the ponderomotive potential,” Phys. review letters124, 174801 (2020)
2020
-
[39]
Transverse electron-beam shaping with light,
M. C. Chirita Mihaila, P. Weber, M. Schneller,et al., “Transverse electron-beam shaping with light,” Phys. Rev. X12, 031043 (2022)
2022
-
[40]
Nonlinear-optical quantum control of free-electron matter waves,
M. Tsarev, J. W. Thurner, and P. Baum, “Nonlinear-optical quantum control of free-electron matter waves,” Nat. Phys. 19, 1350–1354 (2023)
2023
-
[41]
Inelastic electron scattering at a single-beam structured light wave,
S. Ebel and N. Talebi, “Inelastic electron scattering at a single-beam structured light wave,” Commun. Phys.6, 179 (2023)
2023
-
[42]
Electron vortex beams for chirality probing at the nanoscale,
N. L. Streshkova, P. Koutensk`y, and M. Kozák, “Electron vortex beams for chirality probing at the nanoscale,” Phys. Rev. Appl.22, 054017 (2024)
2024
-
[43]
Monochromatization of electron beams with spatially and temporally modulated optical fields,
N. L. Streshkova, P. Koutensk`y, T. Novotn`y, and M. Kozák, “Monochromatization of electron beams with spatially and temporally modulated optical fields,” Phys. Rev. Lett.133, 213801 (2024)
2024
-
[44]
Free-space optical modulation of free electrons in the continuous-wave regime,
C. I. Velasco and F. de Abajo, “Free-space optical modulation of free electrons in the continuous-wave regime,” arXiv preprint arXiv:2412.03410 (2024)
2024 arXiv
-
[45]
Opticalmodulationofelectronbeamsinfreespace,
F.J.G.deAbajoandA.Konečná, “Opticalmodulationofelectronbeamsinfreespace,”Phys.Rev.Lett. 126, 123901 (2021)
2021
-
[46]
Electron round lenses with negative spherical aberration by a tightly focused cylindrically polarized light beam,
Y. Uesugi, Y. Kozawa, and S. Sato, “Electron round lenses with negative spherical aberration by a tightly focused cylindrically polarized light beam,” Phys. Rev. Appl.16, L011002 (2021)
2021
-
[47]
Properties of electron lenses produced by ponderomotive potential with bessel and laguerre–gaussian beams,
Y. Uesugi, Y. Kozawa, and S. Sato, “Properties of electron lenses produced by ponderomotive potential with bessel and laguerre–gaussian beams,” J. Opt.24, 054013 (2022)
2022
-
[48]
A new way of measuring microscope aberrations,
W. Saxton, “A new way of measuring microscope aberrations,” Ultramicroscopy81, 41–45 (2000)
2000
-
[49]
Adjustment of a stem instrument by use of shadow images,
J. Cowley, “Adjustment of a stem instrument by use of shadow images,” Ultramicroscopy4, 413–418 (1979)
1979
-
[50]
Calibration of the operating parameters for an hb5 stem instrument,
J. Lin and J. Cowley, “Calibration of the operating parameters for an hb5 stem instrument,” Ultramicroscopy19, 31–42 (1986)
1986
-
[51]
Practical aspects of atomic resolution imaging and analysis in stem,
E. James and N. Browning, “Practical aspects of atomic resolution imaging and analysis in stem,” Ultramicroscopy 78, 125–139 (1999)
1999
-
[52]
Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems,
J. Liu, “Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems,” J. electron microscopy54, 251–278 (2005)
2005
-
[53]
Measurementmethodofaberrationfromronchigrambyautocorrelation function,
H.Sawada,T.Sannomiya,F.Hosokawa, et al.,“Measurementmethodofaberrationfromronchigrambyautocorrelation function,” Ultramicroscopy108, 1467–1475 (2008)
2008
-
[54]
Some simplified methods of determining the optical characteristics of electron lenses,
K. Spangenberg and L. M. Field, “Some simplified methods of determining the optical characteristics of electron lenses,” Proc. IRE30, 138–144 (1942)
1942
-
[55]
Unipotential electrostatic lenses: Paraxial properties and aberrations of focal length and focal point,
G. F. Rempfer, “Unipotential electrostatic lenses: Paraxial properties and aberrations of focal length and focal point,” J. applied physics57, 2385–2401 (1985)
1985
-
[56]
Simultaneous correction of spherical and chromatic aberrations with an electron mirror: an electron optical achromat,
G. F. Rempfer, D. M. Desloge, W. P. Skoczylas, and O. H. Griffith, “Simultaneous correction of spherical and chromatic aberrations with an electron mirror: an electron optical achromat,” Microsc. Microanal.3, 14–27 (1997)
1997
-
[57]
The theoretical resolution limit of the electron microscope,
O. Scherzer, “The theoretical resolution limit of the electron microscope,” J. Appl. Phys.20, 20–29 (1949)
1949
-
[58]
Optical modulation of electron beams in free space,
F. J. García de Abajo and A. Konečná, “Optical modulation of electron beams in free space,” Phys. Rev. Lett.126, 123901 (2021)
2021
-
[59]
Electron beam shaping with light,
M. C. Chirita Mihaila, “Electron beam shaping with light,” Phd diss., University of Vienna (2022). See pp. 39
2022
-
[60]
Thermal magnetic field noise limits resolution in transmission electron microscopy,
S. Uhlemann, H. Müller, P. Hartel,et al., “Thermal magnetic field noise limits resolution in transmission electron microscopy,” Phys. review letters111, 046101 (2013)
2013
-
[61]
Phase correction for a distorted orbital angular momentum beam using a zernike polynomials-based stochastic-parallel-gradient-descent algorithm,
G. Xie, Y. Ren, H. Huang,et al., “Phase correction for a distorted orbital angular momentum beam using a zernike polynomials-based stochastic-parallel-gradient-descent algorithm,” Opt. letters40, 1197–1200 (2015)
2015
-
[62]
A practical algorithm for the determination of phase from image and diffraction plane pictures,
R. W. Gerchberg, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972)
1972
-
[63]
Nocedal and S
J. Nocedal and S. J. Wright,Numerical optimization (Springer, 1999)
1999
-
[64]
Silicon nitride waveguide as a power delivery component for on-chip dielectric laser accelerators,
S. Tan, Z. Zhao, K. Urbanek,et al., “Silicon nitride waveguide as a power delivery component for on-chip dielectric laser accelerators,” Opt. letters44, 335–338 (2019)
2019
-
[65]
Compression of subrelativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffraction,
T. Van Oudheusden, P. Pasmans, S. Van Der Geer,et al., “Compression of subrelativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffraction,” Phys. review letters105, 264801 (2010)
2010
-
[66]
Femtosecond electron spectroscopy in an electron microscope with high brightness beams,
F. Zhou, J. Williams, and C.-Y. Ruan, “Femtosecond electron spectroscopy in an electron microscope with high brightness beams,” Chem. Phys. Lett.683, 488–494 (2017)
2017
-
[67]
Activecontrolofbrightelectronbeamswithrfopticsforfemtosecondmicroscopy,
J.Williams,F.Zhou,T.Sun, et al.,“Activecontrolofbrightelectronbeamswithrfopticsforfemtosecondmicroscopy,” Struct. Dyn.4(2017)
2017
-
[68]
Laser-induced skyrmion writing and erasing in an ultrafast cryo-lorentz transmission electron microscope,
G. Berruto, I. Madan, Y. Murooka,et al., “Laser-induced skyrmion writing and erasing in an ultrafast cryo-lorentz transmission electron microscope,” Phys. review letters120, 117201 (2018)
2018
-
[69]
Nanoscale mapping of ultrafast magnetization dynamics with femtosecond lorentz microscopy,
N. Rubiano da Silva, M. Möller, A. Feist,et al., “Nanoscale mapping of ultrafast magnetization dynamics with femtosecond lorentz microscopy,” Phys. Rev. X8, 031052 (2018)
2018
-
[70]
Imaging of transient structures using nanosecond in situ tem,
J. S. Kim, T. LaGrange, B. W. Reed,et al., “Imaging of transient structures using nanosecond in situ tem,” Science 321, 1472–1475 (2008)
2008
-
[71]
Development of an ultrafast pulsed ponderomotive phase plate for cryo-electron tomography,
D. X. Du, A. C. Bartnik, C. J. Duncan,et al., “Development of an ultrafast pulsed ponderomotive phase plate for cryo-electron tomography,” bioRxiv pp. 2024–03 (2024)
2024
-
[72]
Matlab version: 9.13.0 (r2022b),
T. M. Inc., “Matlab version: 9.13.0 (r2022b),” (2022)
2022
-
[73]
D. G. Voelz,Computational fourier optics: a MATLAB tutorial , vol. 534 (SPIE press Bellingham, Washington, 2011)
2011
-
[74]
Zernike polynomials: a guide,
V. Lakshminarayanan and A. Fleck, “Zernike polynomials: a guide,” J. Mod. Opt.58, 545–561 (2011)
2011
-
[75]
New phase and amplitude high resolution pulse shaper,
A. Monmayrant and B. Chatel, “New phase and amplitude high resolution pulse shaper,” Rev. Sci. Instruments75, 2668–2671 (2004)
2004
-
[76]
Susceptibility to and correction of azimuthal aberrations in singular light beams,
B. R. Boruah and M. Neil, “Susceptibility to and correction of azimuthal aberrations in singular light beams,” Opt. express 14, 10377–10385 (2006)
2006
-
[77]
Wave-front correction and production of zernike modes with a liquid-crystal spatial light modulator,
G. D. Love, “Wave-front correction and production of zernike modes with a liquid-crystal spatial light modulator,” Appl. optics36, 1517–1524 (1997)
1997
-
[78]
Upper limits for the residual aberrations of a high-resolution aberration- corrected stem,
M. Haider, S. Uhlemann, and J. Zach, “Upper limits for the residual aberrations of a high-resolution aberration- corrected stem,” Ultramicroscopy81, 163–175 (2000)
2000
-
[79]
Reimer,Transmission electron microscopy: physics of image formation and microanalysis , vol
L. Reimer,Transmission electron microscopy: physics of image formation and microanalysis , vol. 36 (Springer, 2013). See pp. 39
2013
Reviewed August 10, 2026 · model on record in the stance chip above.
Discussion (0). Continue with ORCID to comment.