Formation and rapid evolution of domain structure at phase transitions in slightly inhomogeneous ferroelectrics and ferroelastics

We present the analytical study of stability loss and evolution of domain structure in inhomogeneous ferroelectric and ferroelastic samples for exactly solvable models. The model assumes a short-circuited ferroelectric capacitor (free ferroelastic) with two regions with slightly different critical temperatures Tc1 Tc2, where Tc1-Tc2 << Tc1, Tc2. We show that even a tiny inhomogeneity like 10-5 K results in splitting the system into domains below the phase transition temperature. At T < Tc2 the domain width a is proportional to (Tc1-T)/(Tc1-Tc2) and quickly increases with lowering temperature. The minute inhomogeneities in Tc may result from structural (growth) inhomogeneities, which are always present in real samples, and a similar role can be played by inevitable temperature gradients.