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Plasmons in nanoscale metal junctions: optical rectification and thermometry

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arxiv 1107.1147 v1 pith:N3FUGR7P submitted 2011-07-06 cond-mat.mes-hall

Plasmons in nanoscale metal junctions: optical rectification and thermometry

classification cond-mat.mes-hall
keywords electronicopticalinferjunctionjunctionsnanoscaletunnelingallow
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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We use simultaneous electronic transport and optical characterization measurements to reveal new information about electronic and optical processes in nanoscale junctions fabricated by electromigration. Comparing electronic tunneling and photocurrents allows us to infer the optical frequency potential difference produced by the plasmon response of the junction. Together with the measured tunneling conductance, we can then determine the locally enhanced electric field within the junction. In similar structures containing molecules, anti-Stokes and Stokes Raman emission allow us to infer the effective local vibrational and electronic temperatures as a function of DC current, examining heating and dissipation on the nanometer scale.

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