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Growth of atomically smooth thin films of the electronically phase separated manganite (La$_{0.5}$Pr$_{0.5}$)$_{0.67}$Ca$_{0.33}$MnO$_{3}$
Materials Science · Submitted 14 Sep 2011
abstract compiled · 2026-09-23 · no language-model review
The authors' main claim Optimal thin films with step flow growth mode show superior physical properties compared to thin films grown in off-optimal oxygen pressures, {\em viz.} the highest maximum temperature coefficient of resistance, the highest peak-resistivity temperature, and reduced coercive fields.
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The abstract, sentence by sentence
Atomically flat, epitaxial, and stoichiometric thin films of the electronically phase separated compound (La$_{0.5}$Pr$_{0.5}$)$_{0.67}$Ca$_{0.33}$MnO$_{3}$ were grown on as-received and treated NdGaO$_{3}$ substrates by fine tuning of oxygen pressure during deposition. Optimal thin films with step flow growth mode show superior physical properties compared to thin films grown in off-optimal oxygen pressures, {\em viz.} the highest maximum temperature coefficient of resistance, the highest peak-resistivity temperature, and reduced coercive fields. Transport, magnetization, and x-ray diffraction measurements indicate that the oxygen pressure during growth plays a critical role in the formation of oxygen vacancies, cation vacancies, and grain boundaries.
background contribution method result interpretation main claim
| # | sentence | role | the authors' own work | states the main conclusion | strength |
|---|---|---|---|---|---|
| s0 | Atomically flat, epitaxial, and stoichiometric thin films of the electronically phase separated compound (La$_{0.5}$Pr$_{0.5}$)$_{0.67}$Ca$_{0.33}$MnO$_{3}$ were grown on as-received and treated NdGaO$_{3}$ substrates by fine tuning of oxygen pressure during deposition. | contribution 0.50 | 0.95 | 0.16 | asserted 1.00 |
| s1 | Optimal thin films with step flow growth mode show superior physical properties compared to thin films grown in off-optimal oxygen pressures, {\em viz.} the highest maximum temperature coefficient of resistance, the highest peak-resistivity temperature, and reduced coercive fields. | result 1.00 | 0.91 | 0.58 | asserted 1.00 |
| s2 | Transport, magnetization, and x-ray diffraction measurements indicate that the oxygen pressure during growth plays a critical role in the formation of oxygen vacancies, cation vacancies, and grain boundaries. | interpretation 0.62 | 0.91 | 0.33 | hedged possibility 0.77 |
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The paper
Original abstract
Atomically flat, epitaxial, and stoichiometric thin films of the electronically phase separated compound (La$_{0.5}$Pr$_{0.5}$)$_{0.67}$Ca$_{0.33}$MnO$_{3}$ were grown on as-received and treated NdGaO$_{3}$ substrates by fine tuning of oxygen pressure during deposition. Optimal thin films with step flow growth mode show superior physical properties compared to thin films grown in off-optimal oxygen pressures, {\em viz.} the highest maximum temperature coefficient of resistance, the highest peak-resistivity temperature, and reduced coercive fields. Transport, magnetization, and x-ray diffraction measurements indicate that the oxygen pressure during growth plays a critical role in the formation of oxygen vacancies, cation vacancies, and grain boundaries.
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