REVIEW
Asymptotic distribution for two-sided tests with lower and upper boundaries on the parameter of interest
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Asymptotic distribution for two-sided tests with lower and upper boundaries on the parameter of interest
classification
physics.data-an
hep-ex
keywords
asymptoticboundariesdistributioninterestlowerparameterteststwo-sided
read the original abstract
We present the asymptotic distribution for two-sided tests based on the profile likelihood ratio with lower and upper boundaries on the parameter of interest. This situation is relevant for branching ratios and the elements of unitary matrices such as the CKM matrix.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.