RECORD
Determination of the STM tip-graphene repulsive forces by comparative STM and AFM measurements on suspended graphene
Mesoscale and Nanoscale Physics · Submitted 14 Sep 2016
abstract compiled · 2026-09-23 · no language-model review
The authors' main claim Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10e-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.
The compiled record
The paper's own sentences, arranged. Each label is drawn from a closed vocabulary; the number beside it is the probability the classifier gave that label. Numbers in the tables are the authors', checked by code. No sentence in this record was written by a model.
Open the compiled record
The abstract, sentence by sentence
Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over gold nanovoids is deflected 4 - 5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20 - 35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10e-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.
background contribution method result interpretation main claim
| # | sentence | role | the authors' own work | states the main conclusion | strength |
|---|---|---|---|---|---|
| s0 | Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). | method 0.94 | 0.87 | 0.02 | asserted 0.99 |
| s1 | Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. | result 0.93 | 0.79 | 0.02 | asserted 1.00 |
| s2 | These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. | result 0.96 | 0.87 | 0.05 | asserted 0.93 |
| s3 | Similarly, the graphene suspended over gold nanovoids is deflected 4 - 5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). | result 1.00 | 0.87 | 0.05 | asserted 1.00 |
| s4 | Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20 - 35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. | result 0.97 | 0.91 | 0.16 | asserted 0.85 |
| s5 | Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10e-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters. | result 0.91 | 0.94 | 0.88 | asserted 1.00 |
What was examined, and what was not
- arXiv listing abstract v1
- full text
- figures and tables
- references and citing sentences
- relations to other papers
- P abstract
- S sections
- T body sentences
- C citations
- R cross-paper relations
The paper
Original abstract
Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over gold nanovoids is deflected 4 - 5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20 - 35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10e-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.
Human review
Discussion
Know something about this paper? Leave a comment, or highlight any passage above to comment on it.