Paper Citation Record · LEDGER

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope

As of 15 August 2026, this Paper Citation Record lists 45 of 45 outbound references and 0 inbound Pith citation observations for arXiv:1908.04084.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
1908.04084 v2

Coverage vector

measured 45 of 45 reference resolution

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Pith citing papers itemized under the disclosed page cap.

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Reference resolution

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External citation measurements

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Outbound references

Observation 3d89bc47-122c-46d3-9e2e-1a5f7b9a55fc · outbound

This paper cites Slater, R.S.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Slater, R.S

Reference 1

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This paper cites It is intraganularly dual-phase, with approximately 55% L12 gamma-prime volume fraction in a face-centred cubic (FCC) gamma matrix.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope It is intraganularly dual-phase, with approximately 55% L12 gamma-prime volume fraction in a face-centred cubic (FCC) gamma matrix

Reference 2

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This paper cites Gianola, T.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Gianola, T

Reference 3

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This paper cites an unresolved cited work.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 4

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Observation b262d98f-db9a-4fb3-b61f-e133ff4318e2 · outbound

This paper cites Garosshen, T.D.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Garosshen, T.D

Reference 5

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Observation cff41499-303e-43fd-9233-1cc6cd457dfd · outbound

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 6

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Observation becbd4e7-606c-4031-be22-faac76d854ac · outbound

This paper cites Pekin, C.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Pekin, C

Reference 7

Resolution: verified exact; doi, observed 2026-08-14T13:55:20.150750Z

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Observation ce2c1a13-26bc-447f-b31b-78ed1a8c9f07 · outbound

This paper cites Tang, A.J.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Tang, A.J

Reference 8

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Observation 8901db01-e3ef-4932-91bc-26796cd204e4 · outbound

This paper cites Kontis, H.A.M.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Kontis, H.A.M

Reference 9

Resolution: verified exact; doi, observed 2026-08-14T13:55:20.102348Z

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Observation 5608bb84-c1ae-40dc-adda-5bb9aadc951c · outbound

This paper cites Unocic, G.B.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unocic, G.B

Reference 10

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Observation c8bcd5b0-bb97-4c1d-8131-93e95bf9a5c3 · outbound

This paper cites Viswanathan, P.M.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Viswanathan, P.M

Reference 11

Resolution: verified exact; doi, observed 2026-08-14T13:55:20.068359Z

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Observation e271658a-f639-4000-8a34-765cb12d746c · outbound

This paper cites Kontis, A.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Kontis, A

Reference 12

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Observation e50960e3-89ed-4929-ae43-81f04179b6e9 · outbound

This paper cites Winkelmann, G.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Winkelmann, G

Reference 13

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Observation e176b6f0-3c78-4bb9-88e4-2cd599b3ad2d · outbound

This paper cites Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach

Reference 14

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Observation c99ffd8b-27f5-45f8-80e0-34f752052703 · outbound

This paper cites Wilkinson, D.M.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Wilkinson, D.M

Reference 15

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Observation a8b5d8ee-3beb-4932-aba8-b5ed34143188 · outbound

This paper cites Birch, S.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Birch, S

Reference 16

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Observation 32daa0e9-39a1-4614-8632-a9669a3ff69f · outbound

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 17

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 18

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Observation 1dadfc06-0a62-4265-96f7-8847809c01e9 · outbound

This paper cites Winkelmann, Dynamical Simulation of Electron Backscatter Diffraction Patterns, Electron Backscatter Diffr.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Winkelmann, Dynamical Simulation of Electron Backscatter Diffraction Patterns, Electron Backscatter Diffr

Reference 19

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Observation d3a849b3-a7da-48ca-a014-c04f9a34c36f · outbound

This paper cites Callahan, J.C.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Callahan, J.C

Reference 20

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Observation 8090ba1f-cf8b-47f4-9b45-f00e14a0ca6b · outbound

This paper cites Callahan, M.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Callahan, M

Reference 21

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 22

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Observation bb37e4ca-f3c2-45db-ac5e-93ee23a7d1ba · outbound

This paper cites Jolliffe, J.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Jolliffe, J

Reference 23

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 24

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This paper cites Brewer, P.G.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Brewer, P.G

Reference 25

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Unresolved cited work

Reference 26

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Observation 1a9b5d69-3f7c-4989-acc8-09a55d7306c0 · outbound

This paper cites Knop, V.A.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Knop, V.A

Reference 27

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This paper cites Britton, V.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Britton, V

Reference 28

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Jiang, D.J

Reference 29

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Christofidou, M.C

Reference 30

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Hardy, B

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Wold, O.H.J

Reference 32

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Zhang, X

Reference 33

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Raîche, T.A

Reference 34

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This paper cites Ilin, Practical approaches to Principal Component Analysis in the presence of missing values, J.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Ilin, Practical approaches to Principal Component Analysis in the presence of missing values, J

Reference 35

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Tong, A.J

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Campbell, P

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correction dated 2020-01-09. Source: crossref record 10.1016/j.matdes.2019.108454->10.1016/j.matdes.2017.12.049:correction, observed 2026-07-11T03:13:59.854365+00:00. This notice travels one citation hop only.

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This paper cites Meyer, Topographic distance and watershed lines, Signal Processing.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Meyer, Topographic distance and watershed lines, Signal Processing

Reference 38

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This paper cites Kaiser, The Application of Electronic Computers to Factor Analysis, Educ.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Kaiser, The Application of Electronic Computers to Factor Analysis, Educ

Reference 39

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Winkelmann, T

Reference 40

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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Wright, M.M

Reference 41

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This paper cites Brewick, S.I.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Brewick, S.I

Reference 42

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Observation a3765ddb-c52b-470e-acd4-df290eef2f89 · outbound

This paper cites Einsle, A.S.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Einsle, A.S

Reference 43

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Observation 041515df-c45c-47ee-bb43-7db82f855ed0 · outbound

This paper cites Keenan, P.G.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Keenan, P.G

Reference 44

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Observation 317539b1-991d-4705-8fd4-35ef9911e090 · outbound

This paper cites Keenan, Exploiting spatial-domain simplicity in spectral image analysis, Surf.

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope Keenan, Exploiting spatial-domain simplicity in spectral image analysis, Surf

Reference 45

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Pith citing papers

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