Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-14T12:47:58.925587Z
Paper Citation Record · LEDGER
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures
As of 16 August 2026, this Paper Citation Record lists 28 of 28 outbound references and 0 inbound Pith citation observations for arXiv:1908.06518.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-15T06:32:42.880941+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
28 of 28 outbound references displayed
- verified exact0
- verified fuzzy16
- unresolved12
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 09ee6c6f-587f-49a0-8318-9d829bbb166d · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 1
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.514008Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation c6cd77c7-7146-4851-9b5d-f4c8b58b5fe5 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 2
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.496275Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation a772fe39-3520-4ff9-84f5-124910866d27 · outbound
This paper cites Thus, it must stay on the rim.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Thus, it must stay on the rim
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.476059Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 4521bf8e-6d13-4277-a8cf-090362e2dd77 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 4
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.456984Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation ae745e7f-56f5-41f8-ab1f-394c82ef22bd · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 5
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.437352Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 9c24ec04-42af-42e0-94b1-3932ad72d7d5 · outbound
This paper cites This brings new stress into the material, and the crack can grow further.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures This brings new stress into the material, and the crack can grow further
Reference 6
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.416327Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 3f1e3462-1969-447b-a21f-fbcef3393dff · outbound
This paper cites Otherwise, end the simu- lation.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Otherwise, end the simu- lation
Reference 7
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.397429Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation d10a7eb7-c7cd-47e3-88e2-38cbee0ab663 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 8
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.226889Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 68bcf45a-fd06-46d4-8ebe-21477ecf200e · outbound
This paper cites Bronger, P.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Bronger, P
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.361924Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 934d6784-9e13-4687-9486-630bdd02f1fb · outbound
This paper cites Stutzmann, Role of mechanical stress in the light- induced degradation of hydrogenated amorphous silicon, Applied Physics Letters 47, 21 (1985).
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Stutzmann, Role of mechanical stress in the light- induced degradation of hydrogenated amorphous silicon, Applied Physics Letters 47, 21 (1985)
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.341056Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 2567e632-56e9-4f36-89e8-cf96877d8321 · outbound
This paper cites Anastassakis, A.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Anastassakis, A
Reference 11
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.320708Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 0dabebff-2031-4490-9e84-01416b7fe75d · outbound
This paper cites De Wolf, Micro-raman spectroscopy to study local me- chanical stress in silicon integrated circuits, Semiconduc- tor Science and Technology 11, 139 (1996).
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures De Wolf, Micro-raman spectroscopy to study local me- chanical stress in silicon integrated circuits, Semiconduc- tor Science and Technology 11, 139 (1996)
Reference 12
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.300555Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 20cbd2b6-6121-46c7-95a0-d69f02f431c3 · outbound
This paper cites Anastassakis, A.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Anastassakis, A
Reference 13
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.281235Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 85a3bf6b-219d-4ab9-93cf-48dd0a688e81 · outbound
This paper cites Griffith, Vi.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Griffith, Vi
Reference 14
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.263333Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 06e2dbba-c77d-40d8-81f1-042d91c7c3ac · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 15
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.244666Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 36f73471-0eb2-46bf-b093-b2496dc9db80 · outbound
This paper cites Chasiotis, S.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Chasiotis, S
Reference 16
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.045732Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation ffbc1819-ec1d-4c2f-93af-71fd51b7d1ff · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 17
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.208977Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 1725b31d-cb1d-4909-afdc-d3bb901a5ce7 · outbound
This paper cites Anastassakis, Physical problems in microelectron- ics, Proceedings of the 4th International School ISPPM, Varna, Bulgaria , 128 (1985).
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Anastassakis, Physical problems in microelectron- ics, Proceedings of the 4th International School ISPPM, Varna, Bulgaria , 128 (1985)
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.192119Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation af64229d-39bf-4fe7-b3bf-7da3b11d6ae0 · outbound
This paper cites It has been frequently reported (e.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures It has been frequently reported (e
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.379648Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 56d1efc4-1d02-4ca6-a56d-00e19ac4ec14 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 20
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.173499Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 520dbce5-5ec7-48ba-a67e-f396eb79e5e9 · outbound
This paper cites Cimrman et al.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Cimrman et al
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.151493Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 7bf55ec1-8ee8-4a56-913f-0c860f87a8f3 · outbound
This paper cites Richard, M.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Richard, M
Reference 22
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.125256Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation d2ee4bd3-3d3b-4a19-afeb-2b18cf13f655 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 23
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.092403Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 70fa790d-e70e-4ac5-82fb-29ec1c17695e · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 24
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.070825Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 9b95d4ab-83dc-4f41-9ded-438e9c5a9952 · outbound
This paper cites Bagdahn, J.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Bagdahn, J
Reference 25
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:59.024242Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 66e3e806-6a9b-45da-a610-cbf598e28958 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 26
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:59.004897Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation bfb66fc2-44ad-4048-b3fd-41765864c034 · outbound
This paper cites an unresolved cited work.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Unresolved cited work
Reference 27
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:47:58.986832Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 55663535-a973-46f0-a373-73bd11163292 · outbound
This paper cites Gilbert, J, R.
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures Gilbert, J, R
Reference 28
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:47:58.967975Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Pith citing papers
No inbound Pith citation observations are available.