Pith. sign in

REVIEW

Gating of two-dimensional electron systems in InGaAs/InAlAs heterostructures: the role of the intrinsic InAlAs deep donor defects

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2111.10104 v1 pith:5Q6T5VLW submitted 2021-11-19 cond-mat.mes-hall cond-mat.mtrl-sci

classification cond-mat.mes-hallcond-mat.mtrl-sci
keywords inalasgateheterostructuresdeepdefectsdonorelectronelectrostatic
verification ladder T0 review T1 audit T2 compute T3 formal

Signed reviews

No signed human review yet.

0 comments
read the original abstract

We present an analysis of gated InGaAs/InAlAs heterostructures, a device platform to realize spinorbitronic functionalities in semiconductors. The phenomenological model deduced from our magnetotransport experiments allows us to correlate the gate response of the studied two-dimensional electron systems to heterostructure design parameters, in particular the indium concentration. We explain the occurrence of metastable electrostatic configurations showing reduced capacitive coupling and provide gate operation strategies to reach classical field effect control in such heterostructures. Our study highlights the role of the intrinsic InAlAs deep donor defects, as they govern the dynamics of the electrostatic response to gate voltage variations through charge trapping and unintentional tunneling.

Discussion (0). Continue with ORCID to comment.

Pith tools