Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Low charge noise quantum dots with industrial CMOS manufacturing
As of 5 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2212.06464.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-05T06:32:48.257954+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-05-18T13:39:12.276730Z
A source-named dated measurement, never combined with another source.
Source: arxiv_reference, observed 2026-05-18T13:41:25.605784Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation d392c601-3f23-45c8-9e87-fc282534cf95 · inbound
Rapid Autotuning of a SiGe Quantum Dot into the Single-Electron Regime with Machine Learning and RF-Reflectometry FPGA-Based Measurements cites this paper.
Rapid Autotuning of a SiGe Quantum Dot into the Single-Electron Regime with Machine Learning and RF-Reflectometry FPGA-Based Measurements Low charge noise quantum dots with industrial CMOS manufacturing
Reference 6
- Resolution
- malformed identifier
- arxiv_id, observed 2026-05-18T13:41:25.608843Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.