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Unseen Visual Anomaly Generation

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arxiv 2406.01078 v4 pith:5IICNYRC submitted 2024-06-03 cs.CV

classification cs.CV
keywords anomalyanomaliesanomalyanyunseengenerationanomalousdatadescriptions
verification ladder T0 review T1 audit T2 compute T3 formal
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Visual anomaly detection (AD) presents significant challenges due to the scarcity of anomalous data samples. While numerous works have been proposed to synthesize anomalous samples, these synthetic anomalies often lack authenticity or require extensive training data, limiting their applicability in real-world scenarios. In this work, we propose Anomaly Anything (AnomalyAny), a novel framework that leverages Stable Diffusion (SD)'s image generation capabilities to generate diverse and realistic unseen anomalies. By conditioning on a single normal sample during test time, AnomalyAny is able to generate unseen anomalies for arbitrary object types with text descriptions. Within AnomalyAny, we propose attention-guided anomaly optimization to direct SD attention on generating hard anomaly concepts. Additionally, we introduce prompt-guided anomaly refinement, incorporating detailed descriptions to further improve the generation quality. Extensive experiments on MVTec AD and VisA datasets demonstrate AnomalyAny's ability in generating high-quality unseen anomalies and its effectiveness in enhancing downstream AD performance.

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Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. STAGE: Segmentation-oriented Industrial Anomaly Synthesis via Graded Diffusion with Explicit Mask Alignment

    cs.CV 2025-09 conditional novelty 6.0 of 10

    A graded diffusion framework with explicit mask alignment synthesizes realistic, mask-aligned industrial anomalies and improves downstream anomaly segmentation on MVTec and BTAD.

  2. A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects

    cs.CV 2025-07 conditional novelty 3.0 of 10

    A broad survey of industrial defect detection that structures the field by closed-set vs open-set and 2D vs 3D methods, with an emphasis on the rise of open-set anomaly detection.

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