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Room temperature Mott transistor based on resistive switching in disordered V2O3 films grown on Si

Materials Science · Submitted 17 Jul 2024

abstract compiled · 2026-09-23 · no language-model review

The authors' main claim Here, we report a giant resistive switching of about 900 % at room temperature in disordered polycrystalline V2O3-Si thin film stabilized at the IMT phase boundary and associated structural transformation under a small electric field.

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arXiv ID2407.12507 (version 1)
Pith IDBQZTBNJD, Pith's permanent record of this paper and its review
CitationBinoy Krishna De, Divya, Hemant Singh Kunwar, Pavan Nukala, Pragati Sharma, S. B. Roy, Shubham Kumar Parate, V. G. Sathe. "Room temperature Mott transistor based on resistive switching in disordered V2O3 films grown on Si." arXiv:2407.12507 (2024). https://pith.science/paper/BQZTBNJD
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Compiled by classifier-1.13.0 via TypeSafe API, question bank abstract-p1-20260923, 2026-09-23: 1 request, 5,636 input tokens.

What the abstract itself states, as probabilities: claims first 0.05 · states limitation 0.09 · human participants 0.01 · controlled comparison 0.06 · randomized assignment 0.01 · states quantitative result 0.99 · compares with prior results 0.10 · mentions code or data availability 0.02.

The abstract, sentence by sentence

arXiv listing abstract v1. Results and the main claim are underlined; .

Electric field-induced giant resistive switching triggered by insulator-to-metal transition (IMT) is one of the promising approaches for developing a new class of electronics often referred to as Mottronics. Achieving this resistive switching by minimal external field at room temperature is of paramount research and technological interest. Mott-IMT is often associated with structural modification, which is very important for optoelectronic and actuator applications. Here, we report a giant resistive switching of about 900 % at room temperature in disordered polycrystalline V2O3-Si thin film stabilized at the IMT phase boundary and associated structural transformation under a small electric field. The increase of electron population in the a1g band under the field is responsible for the Mott gap collapse that drives the structural transition. Furthermore, we also fabricated a room temperature Mott-FET with a channel ON/OFF resistive ratio of about 15. This study provides a fundamental mechanism of the Mott-IMT in V2O3 as well as its device applications.

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What the classifier reports for each sentence. The number is the probability it gave the label.
#sentencerolethe authors' own workstates the main conclusionstrength
s0 Electric field-induced giant resistive switching triggered by insulator-to-metal transition (IMT) is one of the promising approaches for developing a new class of electronics often referred to as Mottronics. background 1.00 0.05 0.05 asserted 0.89
s1 Achieving this resistive switching by minimal external field at room temperature is of paramount research and technological interest. background 0.90 0.04 0.04 asserted 0.98
s2 Mott-IMT is often associated with structural modification, which is very important for optoelectronic and actuator applications. background 0.99 0.05 0.03 asserted 0.90
s3 Here, we report a giant resistive switching of about 900 % at room temperature in disordered polycrystalline V2O3-Si thin film stabilized at the IMT phase boundary and associated structural transformation under a small electric field. result 0.76 0.97 0.82 asserted 1.00
s4 The increase of electron population in the a1g band under the field is responsible for the Mott gap collapse that drives the structural transition. interpretation 0.99 0.67 0.11 asserted 1.00
s5 Furthermore, we also fabricated a room temperature Mott-FET with a channel ON/OFF resistive ratio of about 15. result 0.77 0.97 0.14 asserted 1.00
s6 This study provides a fundamental mechanism of the Mott-IMT in V2O3 as well as its device applications. contribution 0.58 0.54 0.35 asserted 1.00

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Every quoted sentence on this record is the authors'. Every label is from Pith's closed vocabulary, with the probability shown beside it. Every number in the measurements table is the authors', checked by code. Record as JSON

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Original abstract

Electric field-induced giant resistive switching triggered by insulator-to-metal transition (IMT) is one of the promising approaches for developing a new class of electronics often referred to as Mottronics. Achieving this resistive switching by minimal external field at room temperature is of paramount research and technological interest. Mott-IMT is often associated with structural modification, which is very important for optoelectronic and actuator applications. Here, we report a giant resistive switching of about 900 % at room temperature in disordered polycrystalline V2O3-Si thin film stabilized at the IMT phase boundary and associated structural transformation under a small electric field. The increase of electron population in the a1g band under the field is responsible for the Mott gap collapse that drives the structural transition. Furthermore, we also fabricated a room temperature Mott-FET with a channel ON/OFF resistive ratio of about 15. This study provides a fundamental mechanism of the Mott-IMT in V2O3 as well as its device applications.

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