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A single spin in hexagonal boron nitride for vectorial quantum magnetometry
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abstract
Quantum sensing based on solid-state spin defects provides a uniquely versatile platform for imaging physical properties at the nanoscale under diverse environmental conditions. Operation of most sensors used to-date is based on projective measurement along a single axis combined with computational extrapolation. Here, we show that the individually addressable carbon-related spin defect in hexagonal boron nitride is a multi-axis spin system for vectorial nanoscale magnetometry. We demonstrate how its low symmetry and strongly spin-selective direct and reverse intersystem crossing dynamics provide sub-$\mu$T/$\sqrt{\text{Hz}}$ magnetic-field sensitivity for both on and off-axis bias magnetic field exceeding 50 mT. Alongside these features, the room-temperature operation and the nanometer-scale proximity enabled by the van der Waals host material further consolidate this system as an exciting quantum sensing platform.
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Optically detected magnetic resonance of wafer-scale hexagonal boron nitride thin films
Wafer-scale hBN films grown by MOCVD, CVD, and MBE show optically detected magnetic resonance, with a best volume-normalized sensitivity of 30 µT Hz^-1/2 µm^3/2.
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