Pith. sign in

REVIEW 3 major objections 4 minor 41 references

One-step Fabrication of Sharp Platinum/Iridium Tips via Amplitude-Modulated Alternating-Current Electropolishing

T0 review · 3 major / 4 minor · reviewed 2026-08-12 · deepseek-v4-flash

Challenge this review Re-run · record.json Download PDF Read on arXiv ↗ Review JSON

Pith's one-line read Amplitude-modulated AC electropolishing reproducibly produces platinum/iridium SPM tips that are sharp, clean, and capable of atomic-resolution imaging without complex setups.

desk verdict A genuinely new and useful one-step Pt/Ir tip etching method, held back slightly by a reproducibility claim built on a single 12-tip batch. read the letter →

arxiv 2412.01198 v2 pith:AWOTNZOL submitted 2024-12-02 cond-mat.mtrl-sci physics.app-phphysics.chem-ph

Yuto Nishiwaki , Toru Utsunomiya , Shu Kurokawa , Takashi Ichii This is my paper · ORCID
classification cond-mat.mtrl-sciphysics.app-phphysics.chem-ph
keywords platinum/iridiumtipamplitude-modulatedACelectropolishingscanningtunnelingmicroscopyqPlusatomicforceatomprobetomographyfabricationPt/Iralloy
verification ladder T0 review T1 audit T2 compute T3 formal

The pith

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The reading

This paper argues that the long-standing difficulty of making sharp, clean platinum/iridium scanning probe tips by electropolishing can be overcome in a single step by amplitude-modulating the AC voltage. The modulation cycles between an etching phase, in which platinum is oxidized and dissolved, and a low-voltage phase in which only hydrogen and chlorine gas bubbles are generated, flushing away deposits before they can contaminate the tip. With a carrier frequency between 900 and 1500 Hz, modulation frequency one-tenth of the carrier, 18 V amplitude, and 50% modulation, the authors report reproducible tips with radius of curvature below 100 nm and no oxygen or chlorine contamination by SEM-EDX and atom probe tomography. The same tips produce atomic-resolution STM images of graphite and atomic-resolution qPlus AFM (a quartz-tuning-fork-based atomic force microscope) images of KCl in an ionic liquid, and they image rough platinum surfaces more faithfully than mechanically cut wires. The significance is a simple one-step route to tips that previously demanded reversed-etching baths or multi-step procedures.

What carries the argument

The load-bearing mechanism is the amplitude-modulated AC voltage waveform $V_{\mathrm{out}}(t)=A\sin(2\pi f_0 t)\{1+m\sin(2\pi f_s t)\}$, which alternates etching and gas-flushing half-cycles. The design rests on a threshold: below about 14 V zero-to-peak, the anodic reaction is assumed not to oxidize Pt, generating only $\mathrm{H}_2$ and $\mathrm{Cl}_2$ bubbles; above it, Pt is etched and dissolved. Setting $A(1-m)=9$ V and $A(1+m)=27$ V makes each modulation cycle contain a phase where deposits are flushed by bubbles without further oxidation, followed by a phase where etching resumes, so the tip is cleaned repeatedly during fabrication. The selected parameters $f_0=900$–$1500$ Hz, $f_s=0.1f_0$, $A=18$ V, and $m=50\%$ maximize this cleaning while still allowing sufficient etching, and an automatic shutdown circuit based on effective power cuts the voltage within 50 $\mu\mathrm{s}$ when the wire drops off, preventing over-etching.

What would settle it

A direct test would be to apply only the low-voltage portion of the waveform (about 9 V zero-to-peak) to a Pt80/Ir20 wire (80 wt% Pt, 20 wt% Ir) in the same acetone-saturated CaCl2 solution and check with XPS or an electrochemical quartz crystal microbalance whether any anodic platinum oxide forms; if it does, the proposed cleaning mechanism is not what the paper claims, and the improved tip shape would need another explanation. A second test is to etch with constant amplitude at the same $A=18$ V and $f_0=1000$–$1500$ Hz and the same shutdown circuit; if equally sharp and clean tips result, the amplitude modulation is not the operative factor.

Watch

Extended reading notes

Core claim

The central discovery is that applying an amplitude-modulated AC voltage while electropolishing a Pt80/Ir20 wire (80 wt% Pt, 20 wt% Ir) in an acetone-saturated CaCl2 solution yields tips that are simultaneously sharp, clean, and reproducible. The waveform $V_{\mathrm{out}}(t)=A\sin(2\pi f_0 t)\{1+m\sin(2\pi f_s t)\}$, with $A=18$ V, $m=50\%$, $f_s=0.1f_0$, and $f_0$ between 900 and 1500 Hz, alternates between a high-voltage regime (up to 27 V zero-to-peak) in which Pt oxidation and dissolution take place alongside hydrogen evolution, and a low-voltage regime (down to 9 V zero-to-peak) in which the authors claim only $\mathrm{H}_2$ and $\mathrm{Cl}_2$ gas are generated, without anodic Pt oxidation. The low-voltage half-cycles therefore act as periodic in-situ cleaning that removes PtO$_x$, PtCl$_x$, and precipitated particles during etching rather than afterward, which the authors identify as the reason the tips have small opening angles and clean alloy surfaces. SEM-EDX and atom probe tomography show a homogeneous Pt/Ir surface free of O and Cl, STM resolves the graphite atomic lattice, and qPlus AFM (a quartz-tuning-fork atomic force microscope) resolves atomic-scale corrugation on KCl in an ionic liquid, supporting the claim of atomic resolution in both horizontal and vertical directions.

Load-bearing premise

The load-bearing premise, stated without citation, is that platinum oxidation does not proceed below roughly 14 V zero-to-peak in this alloy and electrolyte, so the low-voltage half-cycles only flush the tip with hydrogen and chlorine gas bubbles and do not oxidize or passivate it.

Editorial extensions

If this is right

  • Tips fabricated this way have radii of curvature below 100 nm and small opening angles, making them suited to imaging rough surfaces where as-cut tips produce distorted images from multiple mini-tips.
  • The one-step process removes the need for reversed-etching baths or multi-step etching, reducing dependence on operator skill and on vibration isolation.
  • The same tips reach atomic resolution in STM in air and in qPlus AFM in liquid, so a single etching method covers both large-area and atomic-scale analyses.
  • SEM-EDX and atom probe tomography indicate the etched surface is a clean Pt/Ir alloy with a Pt:Ir ratio close to the nominal bulk composition.
  • Within a single electrolyte bath the yield of sub-100 nm tips is about 67%, and the bath remains usable for roughly 12 etching cycles before contamination degrades the tip quality.

Reading between the lines

Editorial extensions of the paper, not claims the author makes directly.

  • The same amplitude-modulation principle could be applied to other electrochemical etching systems where passivation or precipitate contamination competes with gas-bubble cleaning, such as tungsten or gold tips.
  • A systematic voltammetric map of Pt80/Ir20 in acetone-saturated CaCl2 would show whether 9 V is the optimal low-level amplitude or whether a different value improves the yield and bath lifetime.
  • Because the low-voltage phase also generates chlorine gas, the cleaning efficiency may depend on chloride concentration and acetone content; varying those could extend the reported bath lifetime beyond about 12 cycles.
  • The trace/retrace comparison suggests the smooth, spherical apex of the etched tip, rather than the radius alone, explains the improved rough-surface imaging; tip-shape reconstruction from the STM data could make this advantage quantitative.
Share X Bluesky LinkedIn Reddit HN

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, and a circularity audit.

Referee Report

3 major / 4 minor

Summary. This manuscript proposes an amplitude-modulated alternating-current electropolishing method for one-step fabrication of sharp, clean Pt/Ir SPM tips. The applied voltage is a sine wave of amplitude A and carrier frequency f0, amplitude-modulated at frequency fs = 0.1 f0 with modulation factor m = 50%, chosen so that the peak voltage A(1+m) = 27 V reaches the etching regime while the trough voltage A(1−m) = 9 V is intended to generate only gas bubbles without Pt oxidation. The authors report that tips with radius of curvature below 100 nm are reproducibly obtained for f0 in 900–1500 Hz in acetone-saturated CaCl2 solution, and they support this with SEM images, a consecutive-fabrication study of 12 tips, SEM-EDX and APT showing a clean Pt/Ir surface, and functional demonstrations of atomic-resolution STM on HOPG and qPlus AFM on KCl(100) in ionic liquid.

Significance. If the method performs as claimed, it is a practical advance over existing multi-step or reverse-etching procedures for Pt/Ir tips, requiring no complex setup or operator-dependent stopping criteria. The paper's strengths include a transparent parameter-dependence study (SI S2), an explicit consecutive-fabrication test with documented failures (SI S3), and functional imaging evidence at atomic resolution in both STM and qPlus AFM. These features make the central claim genuinely testable and the method easy to reproduce independently. The main reservations concern the statistical and compositional evidence supporting the words 'reproducibly' and 'clean surface' in the abstract.

major comments (3)
  1. [Abstract and SI S3] The central claim that the method 'reproducibly provides sharp STM/AFM tips' is supported by only one consecutive-fabrication series of 12 tips from a single bath (8/12 below 100 nm, i.e., 67%) and by the broader yield estimate of 63% in SI S2, which appears to involve very few tips per condition. No confidence intervals, no batch-to-batch replication, and no variation of operator or wire lot are reported. Since reproducibility is the paper's headline claim, this evidence is load-bearing. The authors should either add independent replication data or substantially temper the wording in the abstract and conclusions to 'a 67% yield in a single 12-tip series' rather than 'reproducibly provides'.
  2. [Fig. 3(e, f, g) and main text around 'clean surface'] The claim of a 'clean surface without O or Cl contamination' rests on a single SEM-EDX spectrum and a single APT reconstruction. EDX is not a surface-sensitive technique; its information depth is on the micrometer scale and cannot rule out a thin oxide or chloride layer on the outermost atomic layers. APT is more surface-relevant but was performed on only one tip. The wording 'clean surface' in the abstract and conclusion is stronger than the evidence. The authors should either provide additional tips analyzed by APT or a more surface-sensitive method (e.g., XPS or Auger), or relax the claim to state that no O or Cl was detected by these specific techniques.
  3. [Introduction and SI S2] The mechanism relies on the assertion that 'the oxidation of Pt does not proceed at voltages below about 14 V 0−p', yet this threshold is stated without an inline citation and the supporting check in SI S2 ('we confirmed that Pt was slightly oxidized at A = 13.5 V and that the bubble was generated without the Pt oxidation at A = 9.0 V') is only described, not documented with data or an experimental description. Since the choice A(1−m) = 9 V depends directly on this threshold, the authors should provide the evidence for this check or explicitly frame the threshold as a hypothesis supported only indirectly by the IOUT distortion in Fig. 2 and the overall tip outcomes. The IOUT distortion is acknowledged to be also consistent with bubble formation or precipitation of PtClx, so it is not by itself a proof of the oxidation threshold.
minor comments (4)
  1. [SI S2] The sentence 'fs/f0 would be at most 0.1 to sufficiently oxidize Pt' appears to contradict the stated design goal of suppressing Pt oxidation; this is likely a typo for 'to sufficiently suppress oxidation' or 'to sufficiently etch the tip', and should be corrected.
  2. [Abstract] The phrase 'applying the sinusoidal voltage in the frequency (f0) of 900 Hz ≤ f0 ≤ 1500 Hz' is awkward; consider 'applying a sinusoidal voltage at a carrier frequency f0 in the range 900 Hz ≤ f0 ≤ 1500 Hz'.
  3. [Fig. 4 caption] The tunneling current is written as 'It∼ 1× 101 pA'; this should be '1×10^1 pA' or simply '10 pA'.
  4. [Main text near Fig. 2] The term '0−p' (zero-to-peak) is used inconsistently with 'Vp−p' in the SI; please define the amplitude convention once and use it consistently throughout.

Circularity Check

0 steps flagged · score 0.0 of 10

No significant circularity: the tip-fabrication claims rest on independent SEM, EDX, APT, STM, and qPlus AFM measurements.

full rationale

This is an experimental methods paper. The central claims—that amplitude-modulated AC electropolishing reproducibly yields sharp (<100 nm radius) and clean (no O or Cl) Pt/Ir tips—are supported by direct measurements: SEM images of tip radius and opening angle, EDX and APT composition analyses, STM imaging of HOPG and Pt/mica, and qPlus AFM imaging of KCl(100). None of these outcomes is derived from the parameters that define the method; they are independently observed. The voltage parameters are chosen from a stated mechanistic threshold and then checked empirically: the paper states that Pt oxidation does not proceed below about 14 V (0-p) and that A(1−m)=9 V was selected accordingly, and in Supporting Information S2 the authors verify that at 9.0 V bubbles are generated without Pt oxidation while 13.5 V slightly oxidizes Pt. The interpretation of the IOUT distortion is used to justify the modulation frequency ratio fs=0.1f0, but this is a mechanistic rationale for parameter selection, not a derivation of the measured tip performance. The reproducibility claim is based on small-n statistics (12 tips in a single bath, 67% yield below 100 nm; average yield 63% over the wider parameter scan), which is a legitimate sampling limitation and a correctness/robustness concern, but not circularity: the yield is an empirical result, not an input. The only self-citations (refs. 28 and 29) concern the homebuilt AFM/STM head configuration and are not load-bearing for the etching claim. No fitted parameter is renamed as a prediction, no result is defined in terms of another result, and no load-bearing argument reduces to a self-citation. The derivation chain is self-contained and externally verified by the measurements reported.

Assumptions & free parameters 3 free parameters · 4 assumptions · 0 invented entities

No new physical entities are introduced. The central claim depends on hand-chosen experimental parameters (A, m, fs/f0), on an assumed voltage threshold for Pt oxidation, and on the representativeness of a small set of surface and shape measurements. These are the main assumptions the reader is asked to accept.

free parameters (3)
  • Carrier amplitude A = 18 V
    Selected with m so that peak A(1+m)=27 V approaches prior 28 V and trough A(1-m)=9 V is intended to stay below the assumed 14 V oxidation threshold.
  • Modulation factor m = 50%
    Chosen so A(1-m)=9 V and A(1+m)=27 V from the threshold and prior-work constraints.
  • Modulation frequency ratio fs/f0 = 0.1
    Chosen based on the observation that IOUT distortion appears twice per modulation period, giving fs/f0 at most 0.1.
assumptions (4)
  • domain assumption Pt oxidation does not proceed at voltages below about 14 V (0-p), and only gas generation occurs beneath that threshold.
    Stated in the Introduction and used to set A(1-m)=9 V. The threshold is taken from prior literature on Pt and applied to the Pt/Ir alloy and the CaCl2/H2O/acetone electrolyte.
  • ad hoc to paper The IOUT-t curve distortion at |VOUT| greater than 14 V indicates passivation film formation and impeded current, while negligible distortion below 14 V indicates no oxidation.
    Used to justify the modulation mechanism and the fs/f0=0.1 choice. This is an interpretation of the observed current waveform, not directly verified by surface analysis during etching.
  • domain assumption EDX and APT analyses on the fabricated tips are representative of the surface cleanliness of the method as a whole.
    The claim of a clean surface without O or Cl is based on a single EDX spectrum and APT on limited regions, and EDX has limited surface sensitivity.
  • domain assumption The opening angle and radius of curvature measured from SEM images are representative and sufficient to support the reproducibility claim.
    Yield statistics are based on 12 tips in one bath sequence, and radii are point measurements without uncertainty.

how reviews work

0 comments
Cite this review

Pith. "Pith review of One-step Fabrication of Sharp Platinum/Iridium Tips via Amplitude-Modulated Alternating-Current Electropolishing." pith.science (2026). https://pith.science/paper/AWOTNZOL

@misc{pith2026241201198,
  author       = {Pith},
  title        = {Pith review of: One-step Fabrication of Sharp Platinum/Iridium Tips via Amplitude-Modulated Alternating-Current Electropolishing},
  year         = {2026},
  howpublished = {\url{https://pith.science/paper/AWOTNZOL}},
  note         = {Machine review of arXiv:2412.01198}
}
abstract

The platinum/iridium (Pt/Ir) alloy tip for scanning probe microscopy (SPM) was fabricated by amplitude-modulated alternating-current (AC) electropolishing. The clean tips with a radius of curvature less than 100 nm were reproducibly obtained by applying the sinusoidal voltage in the frequency ($f_0$) of $900\ \mathrm{Hz} \leq f_0 \leq 1500\ \mathrm{Hz}$ with amplitude modulation by the sinusoidal wave in the modulation frequency ($f_s$) of $f_s=0.1f_0$ in $\mathrm{CaCl}_2$/$\mathrm{H_2O}$/acetone solution. The analyses by scanning electron microscopy with an energy-dispersive X-ray analyzer (SEM-EDX) and atom probe tomography (APT) showed that a uniform Pt/Ir alloy was exposed on the tip surface as a clean surface without O or Cl contamination. The STM imaging using the fabricated tip showed that it is more suitable for investigating rough surfaces than conventional as-cut tips and applicable for atomic-resolution imaging. Furthermore, we applied the fabricated tip to qPlus AFM analysis in liquid and showed that it has atomic resolution in both the horizontal and vertical directions. Therefore, it is concluded that the amplitude-modulated AC etching method reproducibly provides sharp STM/AFM tips capable of both atomic resolution and large-area analyses without complex etching setups.

Figures

Figures reproduced from arXiv: 2412.01198 by the authors.

Figure 1
Figure 1. FIG. 1. (a) An ideal waveform of the voltage applied to the cell [PITH_FULL_IMAGE:figures/full_fig_p004_1.png] view at source ↗
Figure 2
Figure 2. shows the current IOUT and voltage VOUT curves versus time t obtained during the etching procedure at f0 = 1000 Hz, fs = 100 Hz, A = 18 V and m = 50 %. IOUT − t and VOUT − t curves for the entire etching time and around the shutdown operation are shown in Figure S1 in the supporting information. In the region where |VOUT| is approximately 14 V (∼ 10 Vrms) or higher, there is significant distortion in the IOUT − t cu… view at source ↗
Figure 3
Figure 3. FIG. 3. (a-c) The SEM images of tips fabricated at [PITH_FULL_IMAGE:figures/full_fig_p007_3.png] view at source ↗
Figures from the paper (1 more)
Figure 4
Figure 4. Figure 4: FIG. 4. (a, b) STM images and line profiles of Pt-deposited mica surface obtained using an [PITH_FULL_IMAGE:figures/full_fig_p009_4.png]

Discussion (0). Continue with ORCID to comment.

Reference graph

Works this paper leans on

41 extracted references · 31 canonical work pages

  1. [1]

    Garnaes , author F

    author author J. Garnaes , author F. Kragh , author K. A. \ Mo/rch ,\ and\ author A. R. \ Thölén ,\ title title Transmission electron microscopy of scanning tunneling tips , \ https://doi.org/10.1116/1.576417 journal journal Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films \ volume 8 ,\ pages 441--444 ( year 1990 ) NoStop

    work page doi:10.1116/1.576417

  2. [2]

    Bian , author C

    author author K. Bian , author C. Gerber , author A. J. \ Heinrich , author D. J. \ Müller , author S. Scheuring ,\ and\ author Y. Jiang ,\ title title Scanning probe microscopy , \ https://doi.org/10.1038/s43586-021-00033-2 journal journal Nature Reviews Methods Primers \ volume 1 ,\ pages 36 ( year 2021 ) NoStop

    work page doi:10.1038/s43586-021-00033-2

  3. [3]

    author author I. H. \ Musselman \ and\ author P. E. \ Russell ,\ title title Platinum/iridium tips with controlled geometry for scanning tunneling microscopy , \ https://doi.org/10.1116/1.576507 journal journal Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films \ volume 8 ,\ pages 3558--3562 ( year 1990 ) NoStop

    work page doi:10.1116/1.576507

  4. [4]

    Binnig , author H

    author author G. Binnig , author H. Rohrer , author C. Gerber ,\ and\ author E. Weibel ,\ title title Surface studies by scanning tunneling microscopy , \ https://doi.org/10.1103/PhysRevLett.49.57 journal journal Physical Review Letters \ volume 49 ,\ pages 57--61 ( year 1982 ) NoStop

    doi:10.1103/physrevlett.49.57

  5. [5]

    author author B. L. \ Rogers , author J. G. \ Shapter , author W. M. \ Skinner ,\ and\ author K. Gascoigne ,\ title title A method for production of cheap, reliable pt-ir tips , \ https://doi.org/10.1063/1.1150523 journal journal Review of Scientific Instruments \ volume 71 ,\ pages 1702--1705 ( year 2000 ) NoStop

    work page doi:10.1063/1.1150523

  6. [6]

    author author A. A. \ Gorbunov , author B. Wolf ,\ and\ author J. Edelmann ,\ title title The use of silver tips in scanning tunneling microscopy , \ https://doi.org/10.1063/1.1143892 journal journal Review of Scientific Instruments \ volume 64 ,\ pages 2393--2394 ( year 1993 ) NoStop

    work page doi:10.1063/1.1143892

  7. [7]

    author author M. Fotino ,\ title title Tip sharpening by normal and reverse electrochemical etching , \ https://doi.org/10.1063/1.1144419 journal journal Review of Scientific Instruments \ volume 64 ,\ pages 159--167 ( year 1993 ) NoStop

    work page doi:10.1063/1.1144419

  8. [8]

    author author A. J. \ Melmed ,\ title title The art and science and other aspects of making sharp tips , \ https://doi.org/10.1116/1.585467 journal journal Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena \ volume 9 ,\ pages 601--608 ( year 1991 ) NoStop

    work page doi:10.1116/1.585467

Show all 41 references
  1. [9]

    author author A. A. \ Gewirth , author D. H. \ Craston ,\ and\ author A. J. \ Bard ,\ title title Fabrication and characterization of microtips for in situ scanning tunneling microscopy , \ @noop journal journal J. Electroanal. Chem \ volume 261 ,\ pages 477--482 ( year 1989 ) NoStop

    1989

  2. [10]

    Libioulle , author Y

    author author L. Libioulle , author Y. Houbion ,\ and\ author J. M. \ Gilles ,\ title title Very sharp platinum tips for scanning tunneling microscopy , \ https://doi.org/10.1063/1.1146153 journal journal Review of Scientific Instruments \ volume 66 ,\ pages 97--100 ( year 199...

    doi

  3. [11]

    Zhang , author Y

    author author J. Zhang , author Y. Gonzalez , author R. Sany ,\ and\ author A. Ruediger ,\ title title A facile fabrication procedure for platinum nanoprobes with high-aspect-ratio and low tip radii via electrochemical etching , \ https://doi.org/10.1063/1.5128653 journal jour...

    doi

  4. [12]

    Takami , author R

    author author T. Takami , author R. Kitamura , author T. Hiramoto , author S. Oki , author K. Yoshioka ,\ and\ author Y. Aoyama ,\ title title Automatic shutdown system of alternating current electrochemical etching for the preparation of a platinum/iridium tip for scanning tu...

    doi

  5. [13]

    author author M. Fotino ,\ title title Nanotips by reverse electrochemical etching , \ https://doi.org/10.1063/1.107468 journal journal Applied Physics Letters \ volume 60 ,\ pages 2935--2937 ( year 1992 ) NoStop

    1992 doi

  6. [14]

    author author J. A. \ Meza , author J. Polesel-Maris , author C. Lubin , author F. Thoyer , author A. Makky , author A. Ouerghi ,\ and\ author J. Cousty ,\ title title Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scannin...

    doi

  7. [15]

    Lindahl , author T

    author author J. Lindahl , author T. Takanen ,\ and\ author L. Montelius ,\ title title Easy and reproducible method for making sharp tips of pt/ir , \ https://doi.org/10.1116/1.590445 journal journal Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Str...

    doi

  8. [16]

    author author A. H. \ Sørensen , author U. Hvid , author M. W. \ Mortensen ,\ and\ author K. A. \ Mørch ,\ title title Preparation of platinum/iridium scanning probe microscopy tips , \ https://doi.org/10.1063/1.1149891 journal journal Review of Scientific Instruments \ volume...

    doi

  9. [17]

    Aoyama \ and\ author T

    author author Y. Aoyama \ and\ author T. Takami ,\ title title Frequency dependence of alternate current electrochemical etching of platinum/iridium wire , \ @noop journal journal Research reports of Kogakuin University \ volume 123 ,\ pages 53--58 ( year 2017 ) NoStop

    2017

  10. [18]

    author author B. R. \ Shrestha , author E. Tada ,\ and\ author A. Nishikata ,\ title title Effect of chloride on platinum dissolution , \ https://doi.org/10.1016/j.electacta.2014.08.014 journal journal Electrochimica Acta \ volume 143 ,\ pages 161--167 ( year 2014 ) NoStop

    2014 doi

  11. [19]

    author author R. S. \ Patil , author V. A. \ Juvekar ,\ and\ author V. M. \ Naik ,\ title title Oxidation of chloride ion on platinum electrode: Dynamics of electrode passivation and its effect on oxidation kinetics , \ https://doi.org/10.1021/ie200663a journal journal Industr...

    doi

  12. [20]

    Devaraj , author D

    author author A. Devaraj , author D. E. \ Perea , author J. Liu , author L. M. \ Gordon , author T. J. \ Prosa , author P. Parikh , author D. R. \ Diercks , author S. Meher , author R. P. \ Kolli , author Y. S. \ Meng ,\ and\ author S. Thevuthasan ,\ title title Three-dimensio...

  13. [21]

    Binnig , author C

    author author G. Binnig , author C. F. \ Quate ,\ and\ author C. Gerber ,\ title title Atomic force microscope , \ https://doi.org/10.1103/PhysRevLett.56.930 journal journal Physical Review Letters \ volume 56 ,\ pages 930--933 ( year 1986 ) NoStop

    doi

  14. [22]

    author author T. F. \ Kelly \ and\ author D. J. \ Larson ,\ title title Local electrode atom probes , \ https://doi.org/10.1016/S1044-5803(99)00055-8 journal journal Materials Characterization \ volume 44 ,\ pages 59--85 ( year 2000 ) NoStop

    doi

  15. [23]

    author author F. J. \ Giessibl ,\ title title The qplus sensor, a powerful core for the atomic force microscope , \ https://doi.org/10.1063/1.5052264 journal journal Review of Scientific Instruments \ volume 90 ,\ pages 011101 ( year 2019 ) NoStop

    doi

  16. [24]

    Auer , author B

    author author A. Auer , author B. Eder ,\ and\ author F. J. \ Giessibl ,\ title title Electrochemical afm/stm with a qplus sensor: A versatile tool to study solid-liquid interfaces , \ https://doi.org/10.1063/5.0168329 journal journal Journal of Chemical Physics \ volume 159 ,...

    doi

  17. [25]

    Ichii , author M

    author author T. Ichii , author M. Fujimura , author M. Negami , author K. Murase ,\ and\ author H. Sugimura ,\ title title Frequency modulation atomic force microscopy in ionic liquid using quartz tuning fork sensors , \ https://doi.org/10.1143/JJAP.51.08KB08 journal journal ...

    doi

  18. [26]

    Ichii , author M

    author author T. Ichii , author M. Negami ,\ and\ author H. Sugimura ,\ title title Atomic-resolution imaging on alkali halide surfaces in viscous ionic liquid using frequency modulation atomic force microscopy , \ https://doi.org/10.1021/jp5078505 journal journal Journal of P...

    doi

  19. [27]

    author author T. R. \ Albrecht , author P. Grütter , author D. Horne ,\ and\ author D. Rugar ,\ title title Frequency modulation detection using high-q cantilevers for enhanced force microscope sensitivity , \ https://doi.org/10.1063/1.347347 journal journal Journal of Applied...

    doi

  20. [28]

    Bao , author Y

    author author Y. Bao , author Y. Nishiwaki , author T. Kawano , author T. Utsunomiya , author H. Sugimura ,\ and\ author T. Ichii ,\ title title Molecular-resolution imaging of ionic liquid/alkali halide interfaces with varied surface charge densities via atomic force microsco...

    doi

  21. [29]

    Nishiwaki , author Y

    author author Y. Nishiwaki , author Y. Yamada , author T. Utsunomiya , author H. Sugimura ,\ and\ author T. Ichii ,\ title title Interfacial structures and mechanical response of highly viscous polymer melt on solid surfaces investigated by atomic force microscopy , \ https://...

    doi

  22. [30]

    Voigtländer , author V

    author author B. Voigtländer , author V. Cherepanov , author S. Korte , author A. Leis , author D. Cuma , author S. Just ,\ and\ author F. Lüpke ,\ title title Invited review article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis , \ https:...

    doi

  23. [31]

    Hasegawa ,\ title Multi-probe scanning tunneling microscopy , \ \ ( publisher Springer New York ,\ year 2007 )\ pp.\ pages 480--505 NoStop

    author author S. Hasegawa ,\ title Multi-probe scanning tunneling microscopy , \ \ ( publisher Springer New York ,\ year 2007 )\ pp.\ pages 480--505 NoStop

    2007

  24. [32]

    Hugenschmidt , author K

    author author M. Hugenschmidt , author K. Adrion , author A. Marx , author E. Müller ,\ and\ author D. Gerthsen ,\ title title Electron-beam-induced carbon contamination in stem-in-sem: Quantification and mitigation , \ https://doi.org/10.1093/micmic/ozac003 journal journal Mi...

    doi

  25. [33]

    \ Pong , author J

    author author W.-T. \ Pong , author J. Bendall ,\ and\ author C. Durkan ,\ title title Observation and investigation of graphite superlattice boundaries by scanning tunneling microscopy , \ https://doi.org/10.1016/j.susc.2006.10.012 journal journal Surface Science \ volume 601...

    doi

  26. [34]

    Chen , author J

    author author Y. Chen , author J. Cai , author M. Liu , author G. Zeng , author Q. Feng ,\ and\ author Z. Chen ,\ title title Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning , \ https://doi.org/10.1002/sca.4950260402 journal jou...

    doi

  27. [35]

    Wang , author Y

    author author Y. Wang , author Y. Ye ,\ and\ author K. Wu ,\ title title Simultaneous observation of the triangular and honeycomb structures on highly oriented pyrolytic graphite at room temperature: An stm study , \ https://doi.org/10.1016/j.susc.2005.12.001 journal journal S...

    doi

  28. [36]

    Schneir , author R

    author author J. Schneir , author R. Sonnenfeld , author P. K. \ Hansma ,\ and\ author J. Tersoff ,\ title title Tunneling microscopy study of the graphite surface in air and water , \ https://doi.org/10.1103/PhysRevB.34.4979 journal journal Physical Review B \ volume 34 ,\ pa...

    doi

  29. [37]

    Tománek , author S

    author author D. Tománek , author S. G. \ Louie , author H. J. \ Mamin , author D. W. \ Abraham , author R. E. \ Thomson , author E. Ganz ,\ and\ author J. Clarke ,\ title title Theory and observation of highly asymmetric atomic structure in scanning-tunneling-microscopy image...

    doi

  30. [38]

    Walker , author P

    author author D. Walker , author P. K. \ Verma , author L. M. \ Cranswick , author R. L. \ Jones , author S. M. \ Clark ,\ and\ author S. Buhre ,\ title title Halite-sylvite thermoelasticity , \ https://doi.org/10.2138/am-2004-0124 journal journal American Mineralogist \ volum...

    doi

  31. [39]

    Schwabegger , author T

    author author G. Schwabegger , author T. Djuric , author H. Sitter , author R. Resel ,\ and\ author C. Simbrunner ,\ title title Morphological and structural investigation of sexithiophene growth on kcl (100) , \ https://doi.org/10.1021/cg3010823 journal journal Crystal Growth...

    doi

  32. [40]

    author author I. V. \ Borzenets , author I. Yoon , author M. W. \ Prior , author B. R. \ Donald , author R. D. \ Mooney ,\ and\ author G. Finkelstein ,\ title title Ultra-sharp metal and nanotube-based probes for applications in scanning microscopy and neural recording , \ htt...

    doi

  33. [41]

    Nakamura , author Y

    author author Y. Nakamura , author Y. Mera ,\ and\ author K. Maeda ,\ title title A reproducible method to fabricate atomically sharp tips for scanning tunneling microscopy , \ https://doi.org/10.1063/1.1149921 journal journal Review of Scientific Instruments \ volume 70 ,\ pa...

    doi

Pith tools

Reviewed August 12, 2026 · model on record in the stance chip above.