High-sensitivity and high-resolution collaborative determination of birefringence coefficient using weak measurement

Precise nanofilm birefringence characterization is essential for high-sensitivity polarization response and strong anti-interference detection in photodetectors. We present a high-sensitivity and high-resolution birefringence coefficient determination system for nm-level membranes based on weak measurement, addressing the sensitivity-resolution trade-off. A tunable bandwidth light source is exploited to achieve simultaneous and complementary measurements of momentum (P-pointer) and intensity (I-pointer), enabling calibration-free operation across various bandwidths, and to realize high-precision phase difference monitoring of the measured membranes. This method maps the birefringence effect to a weak-value amplified signal of spectral shift and light intensity. The optimal resolution, achieved at a spectral width of 6 nm, is $1.12 \times 10^{-8}$ RIU, while the optimal sensitivity is achieved when the light source is a narrow-linewidth coherent laser, reaching 4710 mV/RIU. The linear range of the system covers a broad birefringence coefficient range for crystals, from $10^{-6}$ to 0.1. Furthermore, the auxiliary optical path eliminates substrate interference, achieving a detection limit of birefringence coefficient as low as $10^{-8}$ RIU. This approach, characterized by high precision, high sensitivity, and strong robustness, provides an effective solution for the detection of optical nano-thin membrane parameters.