Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-07T05:12:52.288339Z
Paper Citation Record · LEDGER
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance
As of 21 August 2026, this Paper Citation Record lists 43 of 43 outbound references and 0 inbound Pith citation observations for arXiv:2506.08556.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-20T06:33:59.587034+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
43 of 43 outbound references displayed
- verified exact14
- verified fuzzy12
- unresolved2
- parse uncertain0
- malformed identifier1
- metadata mismatch14
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation aacec638-46c0-45c6-ba4f-8fb39da7abf3 · outbound
This paper cites Mater Sci Semicond Process 134:106002.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Mater Sci Semicond Process 134:106002
Reference 1
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.783832Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation c4910976-3dbf-418a-9386-605249572bc3 · outbound
This paper cites J Semicond 41:061401.
Reference 2
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.493016Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 4774bd8a-f888-4df6-ae3f-4a298fd79a2f · outbound
This paper cites Nanoelectronics : Physics, Materials and Devices.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Nanoelectronics : Physics, Materials and Devices
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.925028Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation dcdade2a-7113-4724-a5b6-810b309dd341 · outbound
This paper cites Int J Appl Eng Res 11:4922- -4929.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Int J Appl Eng Res 11:4922- -4929
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.913395Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 6e4243f2-8dff-4737-b759-55fc1070da19 · outbound
This paper cites Jpn J Appl Phys 31:L455.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Jpn J Appl Phys 31:L455
Reference 5
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.901690Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 2a916fa6-f1d8-41e6-8368-a67c40b98083 · outbound
This paper cites Silicon 15:2385–2405.
Reference 6
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.480427Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 23353334-13b2-4cda-a3c8-790cd28af14f · outbound
This paper cites 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Reference 7
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.889696Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 80507b73-3729-4560-b966-42d2a74eaf7b · outbound
This paper cites IEEE Trans Electron Devices 59:292 –301.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 59:292 –301
Reference 8
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.704093Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation e73eb661-c513-436c-99dd-53a7bd4377e4 · outbound
This paper cites 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC).
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC)
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.878173Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 490b8568-15b0-4828-af56-b17a8cac5dca · outbound
This paper cites Wiley Encyclopedia of Electrical and Electronics Engineering.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Wiley Encyclopedia of Electrical and Electronics Engineering
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.866172Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 2d727411-2081-4d26-8faf-e5f705c936cb · outbound
This paper cites IEEE Electron Device Lett 35:1170–1172.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Electron Device Lett 35:1170–1172
Reference 11
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.629322Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation a15a1e88-2fb0-4136-a62a-677e623b4691 · outbound
This paper cites IEEE Trans Electron Devices 54:1725–1733.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 54:1725–1733
Reference 12
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.548492Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 114cd04a-b137-463d-b1ef-9ca946f644e9 · outbound
This paper cites J Integr Circuits Syst 19:1–12.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance J Integr Circuits Syst 19:1–12
Reference 13
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.468692Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation fed20ef9-2338-4f4b-83c8-617e55765544 · outbound
This paper cites Appl Phys A 125:353.
Reference 14
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.457264Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation a2141945-93cb-440e-b6fd-7d3a85ffe213 · outbound
This paper cites IEEE Trans Electron Devices 58:404–410.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 58:404–410
Reference 15
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.478568Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation fedb8d5f-db92-4543-856d-44869f3cb2e6 · outbound
This paper cites Silicon 14:10101–10113.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Silicon 14:10101–10113
Reference 16
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.445493Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 97c51b7d-fcf4-4f11-b2e1-9aa40b6dac37 · outbound
This paper cites Int J Numer Model Electron Networks, Devices Fields 30:.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Int J Numer Model Electron Networks, Devices Fields 30:
Reference 17
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.433826Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 3c7884e6-6564-4dbe-bfdb-d99c20be4ba1 · outbound
This paper cites J Comput Electron 15:763–769.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance J Comput Electron 15:763–769
Reference 18
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.420946Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation f5e80be7-a854-46f8-952d-934e4b787817 · outbound
This paper cites 2015 IEEE International WIE Co nference on Electrical and Computer Engineering (WIECON -ECE).
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance 2015 IEEE International WIE Co nference on Electrical and Computer Engineering (WIECON -ECE)
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.854763Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 4c25980a-9814-4ce2-a603-2c6fa648bdc1 · outbound
This paper cites IEEE Trans Electron Devices 61:2515 –.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 61:2515 –
Reference 20
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.842928Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 57020bcb-8fa8-4c56-b790-36a4bb5946f4 · outbound
This paper cites IEEE Trans Electron Devices 60:212 8–2134.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 60:212 8–2134
Reference 21
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.320625Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 9a280991-c0fe-41a6-ac30-aed96f07f7d9 · outbound
This paper cites IEEE Trans Electron Devices 55:1013 –1019.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 55:1013 –1019
Reference 22
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.252292Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 1f6907c1-2f3a-4bdf-9dc5-e9db2ba8e7e8 · outbound
This paper cites Curr Appl Phys 12:673 –677.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Curr Appl Phys 12:673 –677
Reference 23
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.409005Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation c3fe7026-dd8b-4627-a6b3-1904727bda82 · outbound
This paper cites IEEE Trans Electron Devices 58:80 –86.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 58:80 –86
Reference 24
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.185001Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 1c514214-1fc1-4ee8-b5a5-ea66989f0992 · outbound
This paper cites IEEE Trans Electron Devices 58:1907 –1913.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 58:1907 –1913
Reference 25
- Resolution
- unresolved
- no resolver link, observed 2026-08-07T05:12:52.221532Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 07c95ee6-ed23-4b82-a4bd-b9a9adfc324e · outbound
This paper cites IEEE Trans Electron Devices 60:92–96.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 60:92–96
Reference 26
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.035102Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation f1f707e1-dce8-4822-9002-4ee075954281 · outbound
This paper cites IEEE Trans Electron Devices 58:2122 –2126.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Electron Devices 58:2122 –2126
Reference 27
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:52.935786Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 76738cf4-958c-4316-9567-81b5c06dd673 · outbound
This paper cites Microelectronics J 129:105587.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Microelectronics J 129:105587
Reference 28
- Resolution
- unresolved
- no resolver link, observed 2026-08-07T05:12:52.233049Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 6f46f640-c4d8-4d96-b81e-554180bb43b0 · outbound
This paper cites Silicon 16:1273 –1282.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Silicon 16:1273 –1282
Reference 29
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.397105Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 01148056-189a-4fe2-b770-6cab2c3bf778 · outbound
This paper cites Silicon 14:1593 –.
Reference 30
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.831121Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation c46138ca-0a41-4bb6-92eb-dfc54f4d68b7 · outbound
This paper cites 2017 14th IEEE India Council International Conference (INDICON).
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance 2017 14th IEEE India Council International Conference (INDICON)
Reference 31
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.819363Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation df1c81cf-7e17-465c-bdb6-64fb999b5d15 · outbound
This paper cites IEEE Trans Device Mater Reliab 16:227 –234.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Device Mater Reliab 16:227 –234
Reference 32
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:52.806412Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation bd81d02d-244d-4cac-9d5f-a2303d061498 · outbound
This paper cites IEEE Trans Device Mater Reliab 17:245–252.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance IEEE Trans Device Mater Reliab 17:245–252
Reference 33
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:52.729785Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 15788376-ed7a-47fb-8bf1-09f02931256c · outbound
This paper cites Silicon 14:3185 –3197.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Silicon 14:3185 –3197
Reference 34
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.370758Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation e5c02fc2-28b1-42ec-9efa-75229bfd39ac · outbound
This paper cites SILVACO Int, Santa Clara, CA, USA.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance SILVACO Int, Santa Clara, CA, USA
Reference 35
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.807383Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation fbef4ecb-2721-4e73-9a53-0230cd00a3e6 · outbound
This paper cites J Sci Technol 53:.
Reference 36
- Resolution
- malformed identifier
- doi_truncated, observed 2026-08-07T05:12:52.357934Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation cc085edf-029e-420b-aaf8-0c6fb7d1e322 · outbound
This paper cites Superlattices Microstruct 102:284–.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Superlattices Microstruct 102:284–
Reference 37
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T05:12:53.795602Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 38fa7361-d95c-4a89-8fa3-ebd78aca81c0 · outbound
This paper cites Microelectron Reliab 55:31–37.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Microelectron Reliab 55:31–37
Reference 38
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.333036Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 5842de63-02d6-4b0f-8aaf-5c6554a97887 · outbound
This paper cites Solid State Electron 52:1318–1323.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Solid State Electron 52:1318–1323
Reference 39
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.320143Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 3255a7eb-0eb7-47c3-aec6-2aa896e6fc08 · outbound
This paper cites Micro and Nanostructures 195:207951.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Micro and Nanostructures 195:207951
Reference 40
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:52.655962Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation a2cfa18d-06b4-475b-ba8b-e1e5c151d64f · outbound
This paper cites an unresolved cited work.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Unresolved cited work
Reference 299
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.345348Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 60b8fdc4-8366-4f18-872e-3414b54dc837 · outbound
This paper cites an unresolved cited work.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Unresolved cited work
Reference 1604
- Resolution
- verified exact
- doi, observed 2026-08-07T05:12:52.383843Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 9f014f80-3538-4b2d-93c3-de81d5bd7e71 · outbound
This paper cites an unresolved cited work.
Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance Unresolved cited work
Reference 2522
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-07T05:12:53.405860Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Pith citing papers
No inbound Pith citation observations are available.